المؤلفون: Grover, R., Acosta, T., AnDyke, C., Armagan, E., Auth, C., Chugh, S., Downes, K., Hattendorf, M., Jack, N., Joshi, S., Kasim, R., Leatherman, G., Lee, S.-H., Lin, C.-Y., Madhavan, A., Mao, H., Lowrie, A., Martin, G., McPherson, G., Nayak, P., Neale, A., Nminibapiel, D., Orr, B., Palmer, J., Pelto, C., Poon, S. S., Post, I., Pramanik, T., Rahman, A., Ramey, S., Seifert, N., Sethi, K., Schmitz, A., Wu, H., Yeoh, A.

المصدر: 2020 IEEE International Reliability Physics Symposium (IRPS)

الاتاحة: http://dx.doi.org/10.1109/irps45951.2020.9128345
http://xplorestaging.ieee.org/ielx7/9125439/9128217/09128345.pdf?arnumber=9128345