المؤلفون: Tucto K., Flores L., Guerra J., Töfflinger J., Dulanto J., Grieseler R., Osvet A., Batentschuk M., Weingärtner R.

مصطلحات موضوعية: Aluminum compounds, Annealing, Cobalt compounds, Energy dispersive X ray analysis, Infrared devices, Luminescence, Nitrides, Photoelectrochemical cells, Photovoltaic cells, Rare earth elements, Semiconductor doping, Sputtering, Thin films, X ray diffraction analysis, Aluminum oxynitride, Aluminum oxynitride thin films, Annealing temperatures, Doping concentration, Near-infrared emissions, Photoluminescence measurements, Radio frequency magnetron sputtering, Silicon substrates, Ytterbium compounds

Relation: MRS Advances; CONV-000236-2015-FONDECYT-DE - PROMOCION 1; http://hdl.handle.net/20.500.12390/753; 2-s2.0-85047181476

الاتاحة: https://hdl.handle.net/20.500.12390/753
https://doi.org/10.1557/adv.2017.478