المؤلفون: Loh, Tian Hong, Emrah, Tas, Pythoud, Frederic, Fan, Wei, Allal, Djamel, Alomainy, Akram

مصطلحات موضوعية: Electrical Engineering and Systems Science - Signal Processing, Electrical Engineering and Systems Science - Systems and Control

URL الوصول: http://arxiv.org/abs/2404.15798

المؤلفون: Seck, Daouda, Allal, Djamel, Haddadi, Kamel

المساهمون: Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)-JUNIA (JUNIA), Université catholique de Lille (UCL)-Université catholique de Lille (UCL), Circuits Systèmes Applications des Micro-ondes - IEMN (CSAM - IEMN), Université catholique de Lille (UCL)-Université catholique de Lille (UCL)-Centrale Lille-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)-JUNIA (JUNIA), Laboratoire National de Métrologie et d'Essais Trappes (LNE), no information

المصدر: 2024 IEEE Symposium on Wireless Technology & Applications (ISWTA)
https://hal.science/hal-04705775
2024 IEEE Symposium on Wireless Technology & Applications (ISWTA), Jul 2024, Kuala Lumpur, Malaysia. pp.260-263, ⟨10.1109/ISWTA62130.2024.10651788⟩

مصطلحات موضوعية: [PHYS]Physics [physics], [SPI]Engineering Sciences [physics]

جغرافية الموضوع: Kuala Lumpur, Malaysia

الاتاحة: https://hal.science/hal-04705775
https://hal.science/hal-04705775v1/document
https://hal.science/hal-04705775v1/file/Seck_2024_ISWTA.pdf
https://doi.org/10.1109/ISWTA62130.2024.10651788

المؤلفون: Mubarak, Faisal, Phung, Gia Ngoc, Arz, Uwe, Haddadi, Kamel, Roch-Jeune, Isabelle, Ducournau, Guillaume, Flisgen, Thomas, Doerner, Ralf, Allal, Djamel, Jayasankar, Divya, 1994, Stake, Jan, 1971, Schmidt, Robin, Fisher, Gavin, Ridler, Nick, Shang, Xiaobang

المصدر: THz-metrologi för moderna trådlösa system IEEE Transactions on Terahertz Science and Technology.

URL الوصول: https://research.chalmers.se/publication/544978

المؤلفون: Liu, Zicheng, Allal, Djamel, Cox, Maurice, Wiart, Joe

المصدر: Int. J. Environ. Res. Public Health 2020, 17(6), 2111

مصطلحات موضوعية: Electrical Engineering and Systems Science - Signal Processing, Physics - Computational Physics, Physics - Medical Physics

URL الوصول: http://arxiv.org/abs/2003.02630

المؤلفون: Phung, Gia Ngoc, Arz, Uwe, Pham, Thi Dao, Allal, Djamel, Lahbacha, Khitem, Miele, Gianfranco, Maffucci, Antonio

المصدر: IEEE SPI, 2023 IEEE 27th Workshop on Signal and Power Integrity, Aveiro (Portugal), 07-10 May 2023

مصطلحات موضوعية: thin-film microstriplines, parasitic effects, EM simulations

Relation: https://doi.org/10.1109/SPI57109.2023.10145555; https://zenodo.org/communities/20ind03; https://doi.org/10.5281/zenodo.10548538; https://doi.org/10.5281/zenodo.10548539; oai:zenodo.org:10548539

الاتاحة: https://doi.org/10.5281/zenodo.10548539

المؤلفون: Celep, Murat, Phung, Gia Ngoc, Ziade, Francois, Stokes, Daniel, Ruhaak, Jurgen, Kuhlmann, Karsten, Allal, Djamel

المصدر: IMS 2022, International Microwave Symposium

مصطلحات موضوعية: calibration, measurement uncertainty, microcalorimeter, microwave power measurement, effective efficiency, power sensor

Relation: https://doi.org/10.1109/IMS37962.2022.9865569; https://zenodo.org/communities/temmt; https://doi.org/10.5281/zenodo.7303595; https://doi.org/10.5281/zenodo.7303596; oai:zenodo.org:7303596

الاتاحة: https://doi.org/10.5281/zenodo.7303596

المؤلفون: Lahbacha, Khitem, Di Capua, Giulia, Miele, Gianfranco, Maffucci, Antonio, Pham, Thi Do, Allal, Djamel, Phung, Gia Ngoc, Arz, Uwe

المصدر: IEEE SPI 2023, 2023 IEEE 27th Workshop on Signal and Power Integrity, Aveiro (Portugal), 07-10 May 2023

Relation: https://doi.org/10.1109/SPI57109.2023.10145525; https://zenodo.org/communities/20ind03; https://doi.org/10.5281/zenodo.10548982; https://doi.org/10.5281/zenodo.10548983; oai:zenodo.org:10548983

الاتاحة: https://doi.org/10.5281/zenodo.10548983

المؤلفون: Pham, Thi Dao, Ngoc Phung, Gia, Lahbacha, Khitem, Maffucci, Antonio, Miele, Gianfranco, Arz, Uwe, Allal, Djamel

المصدر: 2024 Conference on Precision Electromagnetic Measurements (CPEM) ; page 1-2

الاتاحة: http://dx.doi.org/10.1109/cpem61406.2024.10646002
http://xplorestaging.ieee.org/ielx8/10645824/10645825/10646002.pdf?arnumber=10646002

المؤلفون: Allal, Djamel, Sayegh, Ahmed, Rausche, Florian

المصدر: 2024 Conference on Precision Electromagnetic Measurements (CPEM) ; page 1-2

الاتاحة: http://dx.doi.org/10.1109/cpem61406.2024.10645995
http://xplorestaging.ieee.org/ielx8/10645824/10645825/10645995.pdf?arnumber=10645995

المؤلفون: Lahbacha, Khitem, Di Capua, Giulia, Miele, Gianfranco, Maffucci, Antonio, Chiariello, Andrea Gaetano, Pham, Thi Dao, Allal, Djamel

المساهمون: European Union

المصدر: 2024 IEEE International Symposium on Measurements & Networking (M&N) ; page 1-6

الاتاحة: http://dx.doi.org/10.1109/mn60932.2024.10615657
http://xplorestaging.ieee.org/ielx8/10615257/10615262/10615657.pdf?arnumber=10615657

المؤلفون: Shang, Xiaobang, Ridler, Nick, Arz, Uwe, Phung, Gia Ngoc, Roch-Jeune, Isabelle, Ducournau, Guillaume, Haddadi, Kamel, Flisgen, Thomas, Doerner, Ralf, Allal, Djamel, Jayasankar, Divya, 1994, Stake, Jan, 1971, Schimdt, Robin, Fisher, Gavin, Mubarak, Faisal

المصدر: THz-metrologi för moderna trådlösa system Traceability for electrical measurements at millimetre-wave and terahertz frequencies for communications and electronics technologies (TEMMT) 53rd European Microwave Conference, Berlin, Germany 53rd European Microwave Conference. :624-627

مصطلحات موضوعية: S-parameter, terahertz, measurement comparison, On wafer measurement, coplanar waveguide, millimetre-wave

URL الوصول: https://research.chalmers.se/publication/538546
https://research.chalmers.se/publication/537604
https://research.chalmers.se/publication/539222

المؤلفون: Lahbacha, Khitem, Ngoc Phung, Gia, Dao Pham, Thi, Arz, Uwe, Di Capua, Giulia, Maffucci, Antonio, Miele, Gianfranco, Allal, Djamel

المصدر: Components, Packaging, and Manufacturing Technology, IEEE Transactions on; November 2024, Vol. 14 Issue: 11 p2032-2042, 11p

المؤلفون: Shang, Xiaobang, Naftaly, Mira, Skinner, James, Ausden, Liam, Gregory, Andrew, Ridler, Nick M., Arz, Uwe, Ngoc Phung, Gia, Ulm, David, Kleine-Ostmann, Thomas, Allal, Djamel, Wojciechowski, Marcin, Kazemipour, Alireza, Gaumann, Gregory, Hudlicka, Martin

المصدر: IEEE Transactions on Microwave Theory and Techniques; November 2024, Vol. 72 Issue: 11 p6473-6484, 12p

المؤلفون: Celep, Murat, Stokes, Daniel, Danacı, Erkan, Ziadé, François, Zagrajek, Przemysław, Wojciechowski, Marcin, Phung, Gia Ngoc, Kuhlmann, Karsten, Kazemipour, Alireza, Durant, Steven, Hesler, Jeffrey, Instone, Ian, Sakarya, Handan, Allal, Djamel, Rühaak, Jürgen, Skinner, James, Stalder, Daniel

المصدر: Metrology; Jun2024, Vol. 4 Issue 2, p279-294, 16p

مصطلحات موضوعية: POWER measurement (Electricity), MILLIMETER waves, THERMOELECTRIC power, FREQUENCY multipliers, WAVEGUIDES

المؤلفون: Allal, Djamel, Arz, Uwe, Gäumann, Gregory, Gregory, Andrew, Hudlička, Martin, Kazemipour, Alireza, Kleine-Ostmann, Thomas, Phung, Gia Ngoc, Maršík, Přemysl, Naftaly, Mira, Sakarya, Handan, Shang, Xiaobang, Ulm, David, Wojciechowski, Marcin, Zagrajek, Przemyslaw

مصطلحات موضوعية: material characterization, permittivity, measurement uncertainty

Relation: https://zenodo.org/communities/temmt; https://doi.org/10.5281/zenodo.7442686; https://doi.org/10.5281/zenodo.7442687; oai:zenodo.org:7442687

الاتاحة: https://doi.org/10.5281/zenodo.7442687

المؤلفون: Allal, Djamel, Bannister, Richard, Buisman, Koen, Capriglione, Domenico, Di Capua, Giulia, Garcia-Patron, Martin, Gatzweiler, Thomas, Gellersen, Frauke, Harzheim, Thomas, Heuermann, Holger, Hoffmann, Johannes, Izbrodin, Alexander, Kuhlmann, Karsten, Lahbacha, Khitem, Maffucci, Antonio, Miele, Gianfranco, Mubarak, Faisal, Salter, Martin, Pham, Thi-Dao, Sayegh, Ahmed, Singh, Dilbagh, Stein, Friederike, Zeier, Markus

المصدر: 2022 IEEE International Symposium on Measurements & Networking (M&N), Padua, 18-20 July 2022

مصطلحات موضوعية: FPGA, Signal Integrity, Power Integrity, Passive Inter-Modulation, Metrological Characterization

Relation: https://doi.org/10.1109/MN55117.2022.9887740; https://zenodo.org/communities/20ind03; https://doi.org/10.5281/zenodo.7899777; https://doi.org/10.5281/zenodo.7899778; oai:zenodo.org:7899778

الاتاحة: https://doi.org/10.5281/zenodo.7899778

المؤلفون: Kazemipour, Alireza, Hoffmann, Johannes, Wollensack, Michael, Allal, Djamel, Hudlicka, Martin, Ruefenacht, Juerg, Stalder, Daniel, Zeier, Markus

المصدر: CPEM, 2020 Conference on Precision Electromagnetic Measurements, Denver (Aurora), CO, USA, 24-28 August 2020

مصطلحات موضوعية: material characterization, parameter extraction, VNA time-gating, RF metrology, measurement uncertainty

Relation: https://doi.org/10.1109/CPEM49742.2020.9191818; https://zenodo.org/communities/temmt; https://doi.org/10.5281/zenodo.4243043; https://doi.org/10.5281/zenodo.4243044; oai:zenodo.org:4243044

الاتاحة: https://doi.org/10.5281/zenodo.4243044

المؤلفون: Kazemipour, Alireza, Hoffmann, Johannes, Wollensack, Michael, Hudlicka, Martin, Rufenacht, Jurg, Stalder, Daniel, Allal, Djamel, Gaumann, Gregory, Zeier, Markus

المساهمون: 18SIB09 TEMMT (Traceability for Electrical Measurement at Millimeter-Wave and Terahertz Frequencies for Communications and Electronics Technologies) Project, European Metrology Programme for Innovation and Research (EMPIR) Programme, Participating States and from the European Union’s Horizon 2020 Research and Innovation Programme

المصدر: IEEE Transactions on Instrumentation and Measurement ; volume 70, page 1-10 ; ISSN 0018-9456 1557-9662

الاتاحة: http://dx.doi.org/10.1109/tim.2021.3077660
http://xplorestaging.ieee.org/ielx7/19/9259274/09424026.pdf?arnumber=9424026

المؤلفون: Mokhtari, Cerine, Seck, Daouda, Allal, Djamel, Lenoir, Clément, Sebbache, Mohamed, Berthe, Maxime, Haddadi, Kamel

المساهمون: Circuits Systèmes Applications des Micro-ondes - IEMN (CSAM - IEMN ), Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)-JUNIA (JUNIA), Université catholique de Lille (UCL)-Université catholique de Lille (UCL)-Centrale Lille-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)-JUNIA (JUNIA), Université catholique de Lille (UCL)-Université catholique de Lille (UCL), Laboratoire National de Métrologie et d’Essais (LNE), Plateforme de Caractérisation Multi-Physiques - IEMN (PCMP - IEMN), The project is supported by the Nano 2022 Plan in the frame of the common lab IEMN / STMicroelectronics® and by the European Metrology Programme for Innovation and Research (EMPIR) Project 18SIB09 Traceability for electrical measurements at millimetre-wave and terahertz frequencies for communications and electronics technologies. The EMPIR Programme is co-financed by the Participating States and from the European Union's Horizon 2020 Research and Innovation Programme., PCMP PCP, Renatech Network, Laboratoire commun STMicroelectronics-IEMN T1

المصدر: 2023 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO)
https://hal.science/hal-04182408
2023 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO), Jun 2023, Winnipeg, Canada. pp.22-24, ⟨10.1109/NEMO56117.2023.10202165⟩

مصطلحات موضوعية: On-wafer measurements, extreme impedance measurement, ground-signal-ground (GSG) probes, calibration, vector network analyzer (VNA), [PHYS]Physics [physics], [SPI]Engineering Sciences [physics]

جغرافية الموضوع: Winnipeg

Time: Winnipeg, Canada

Relation: hal-04182408; https://hal.science/hal-04182408

الاتاحة: https://hal.science/hal-04182408
https://doi.org/10.1109/NEMO56117.2023.10202165

المؤلفون: Morán-Meza, José A, Delvallée, Alexandra, Allal, Djamel, Piquemal, François

المساهمون: EMPIR project ADVENT

المصدر: Measurement Science and Technology ; volume 31, issue 7, page 074009 ; ISSN 0957-0233 1361-6501

الاتاحة: http://dx.doi.org/10.1088/1361-6501/ab82c1
https://iopscience.iop.org/article/10.1088/1361-6501/ab82c1
https://iopscience.iop.org/article/10.1088/1361-6501/ab82c1/pdf