المؤلفون: Alessio Griffoni, Geert Willems, Franco Zanon, Bart Vandevelde

المصدر: IEEE Transactions on Device and Materials Reliability. 18:377-382

مصطلحات موضوعية: Materials science, 020208 electrical & electronic engineering, Mechanical engineering, 02 engineering and technology, 01 natural sciences, Finite element method, Electronic, Optical and Magnetic Materials, law.invention, 010104 statistics & probability, law, Soldering, 0202 electrical engineering, electronic engineering, information engineering, Range (statistics), Computer-aided, 0101 mathematics, Electrical and Electronic Engineering, Reliability design, Safety, Risk, Reliability and Quality, Joint (geology), Reliability (statistics), Light-emitting diode

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6bc24d3cbb1aca53ea07a1b12f1509f5
https://doi.org/10.1109/tdmr.2018.2849083

المؤلفون: Gaudenzio Meneghesso, Stefano Marconi, Enrico Zanoni, Matteo Meneghini, Marco Barbato, Matteo Dal Lago, S. Vaccari, Alberto Alfier, Nicola Trivellin, Alessio Griffoni, Giovanni Verzellesi

المصدر: Microelectronics Reliability. 54:1143-1149

مصطلحات موضوعية: Materials science, Light-emitting diodes, ESD, Gallium nitride, Series and parallel circuits, law.invention, chemistry.chemical_compound, Transmission line, law, Robustness (computer science), Electronic engineering, Electrical and Electronic Engineering, Robustness, Safety, Risk, Reliability and Quality, Gallium Nitride, light emitting diodes, Electrostatic discharge (ESD), degradation, Transmission Line Pulse (TLP), business.industry, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Wavelength, chemistry, gallium nitride, Optoelectronics, RGB color model, business, Voltage, Light-emitting diode

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ec05d8d7576159ec48ed1ecd5e6a27d7
https://doi.org/10.1016/j.microrel.2014.02.009

المؤلفون: P. Paillet, Cor Claeys, Daniel M. Fleetwood, Marc Gaillardin, Ronald D. Schrimpf, Michael L. Alles, Alessio Griffoni, Eddy Simoen, F. El-Mamouni, Robert A. Reed

المصدر: IEEE Transactions on Nuclear Science. 60:1970-1991

مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, business.industry, Transistor, Electrical engineering, Silicon on insulator, Substrate (electronics), Radiation, law.invention, Planar, Nuclear Energy and Engineering, CMOS, law, Absorbed dose, MOSFET, Optoelectronics, Electrical and Electronic Engineering, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::23d65900ec247f51294746c73f8fc43a
https://doi.org/10.1109/tns.2013.2255313

المؤلفون: Eddy Simoen, C. Claeys, Abdelkarim Mercha, Daisuke Kobayashi, Felice Crupi, Serana Iacovo, Alessio Griffoni, Philippe Roussel

المصدر: ECS Transactions. 50:213-222

مصطلحات موضوعية: Materials science, CMOS, business.industry, Electronic engineering, Statistical parameter, Optoelectronics, Wafer, Trapping, Dielectric, Radiation, business, Metal gate, Layer (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4854a43927f3fe26891869f2693fb5d4
https://doi.org/10.1149/05005.0213ecst

المؤلفون: Daniel M. Fleetwood, En Xia Zhang, Guido Groeseneken, N. N. Mahatme, Marc Aoulaiche, Bharat L. Bhuva, Ronald D. Schrimpf, D. Linten, Alessio Griffoni, Robert A. Reed, Eddy Simoen, Malgorzata Jurczak

المصدر: IEEE Transactions on Nuclear Science. 59:2966-2973

مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, business.industry, Transistor, Silicon on insulator, Geometry, Hardware_PERFORMANCEANDRELIABILITY, Trapping, Buried oxide, law.invention, Threshold voltage, Nuclear Energy and Engineering, law, Absorbed dose, MOSFET, Optoelectronics, Electrical and Electronic Engineering, business, Leakage (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::20b0b64794cf466b5699437c3cf26231
https://doi.org/10.1109/tns.2012.2223828

المؤلفون: Robert A. Reed, Dimitri Linten, N. D. Pate, G. Vizkelethy, D. McMorrow, En Xia Zhang, Eddy Simoen, Alessio Griffoni, F. El-Mamouni, Ronald D. Schrimpf, Nicholas C. Hooten, Jeffrey H. Warner, Kenneth F. Galloway, Cor Claeys

المصدر: IEEE Transactions on Nuclear Science. 58:2563-2569

مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, Charge (physics), Substrate (electronics), Electrostatic induction, Laser, Fin (extended surface), law.invention, Nuclear Energy and Engineering, law, MOSFET, Electrical and Electronic Engineering, Diffusion (business), Atomic physics, Absorption (electromagnetic radiation)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::df2732210d2fa7bca304bc1e04252b78
https://doi.org/10.1109/tns.2011.2171994

المؤلفون: Shih-Hung Chen, Jacopo Franco, Dimitri Linten, B. Kaczer, Alessio Griffoni, Steven Thijs, A. De Keersgieter, Guido Groeseneken

المصدر: IEEE Transactions on Electron Devices. 58:2061-2071

مصطلحات موضوعية: Engineering, Electrostatic discharge, business.industry, Transistor, Electrical engineering, High voltage, Hardware_PERFORMANCEANDRELIABILITY, Electronic, Optical and Magnetic Materials, law.invention, Impact ionization, law, Charged-device model, MOSFET, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, Electrical and Electronic Engineering, business, Low voltage, NMOS logic, Hardware_LOGICDESIGN

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4fdd6926f8f652452d9a5c4e6e69dddd
https://doi.org/10.1109/ted.2011.2132760

المؤلفون: Eddy Simoen, Cor Claeys, Gaudenzio Meneghesso, Sofie Put, Alessandro Paccagnella, Alessio Griffoni, Andrea Cester, Simone Gerardin

المصدر: ECS Transactions. 27:39-46

مصطلحات موضوعية: Damage detection, Reliability (semiconductor), Materials science, CMOS, business.industry, Electrical engineering, Silicon on insulator, Radiation, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d0d28894d1ccce4a19d53fd23e67bff1
https://doi.org/10.1149/1.3360593

المؤلفون: Dimitri Linten, David Trémouilles, Christian Russ, Guido Groeseneken, Rita Rooyackers, Alessio Griffoni, Nadine Collaert, Mirko Scholz, Malgorzata Jurczak, Steven Thijs

المصدر: IEEE Transactions on Device and Materials Reliability. 10:338-346

مصطلحات موضوعية: Electrostatic discharge, business.industry, Computer science, Electrical engineering, Silicon on insulator, Hardware_PERFORMANCEANDRELIABILITY, Electronic, Optical and Magnetic Materials, Parasitic capacitance, Logic gate, MOSFET, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, Design methods, Voltage drop, NMOS logic, Hardware_LOGICDESIGN

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::daca5ed2eff123447e6cbbe0dd8cc9d0
https://doi.org/10.1109/tdmr.2010.2049651

المؤلفون: Simone Gerardin, Cor Claeys, Alessio Griffoni, Alessandro Paccagnella, Eddy Simoen, Gaudenzio Meneghesso

المصدر: IEEE Transactions on Nuclear Science. 57:1924-1932

مصطلحات موضوعية: Nuclear and High Energy Physics, reliability, Materials science, Dielectric strength, business.industry, Silicon on insulator, Time-dependent gate oxide breakdown, Silicon on Insulator, FinFET, ion-irradiation, radiation effects, Ion, Nuclear Energy and Engineering, Gate oxide, MOSFET, Electronic engineering, Optoelectronics, Irradiation, Electrical and Electronic Engineering, business, High-κ dielectric

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f19c3d96dcd541edb2eca8a04a64c073
https://doi.org/10.1109/tns.2010.2040196

المؤلفون: Mirko Scholz, C. Russ, Cor Claeys, Guido Groeseneken, Eddy Simoen, David Trémouilles, Alessio Griffoni, Dimitri Linten, Gaudenzio Meneghesso, Steven Thijs

المصدر: IEEE Transactions on Device and Materials Reliability. 10:130-141

مصطلحات موضوعية: Electrostatic discharge, Materials science, Silicon, business.industry, Capacitive sensing, technology, industry, and agriculture, chemistry.chemical_element, Silicon on insulator, CMOS technology, Silicon on Insulator, complex mixtures, Electronic, Optical and Magnetic Materials, Strain engineering, chemistry, Gate oxide, Electrostatic discharge (ESD), Transmission Line Pulse (TLP), MOSFET, Electronic engineering, Optoelectronics, Microelectronics, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::47a130188a39a1cfadc97897625623a0
https://doi.org/10.1109/tdmr.2009.2036156

المؤلفون: Harald Gossner, David Trémouilles, Guido Groeseneken, Mirko Scholz, Nadine Collaert, Malgorzata Jurczak, Alessio Griffoni, Dimitri Linten, Charvaka Duvvury, Steven Thijs, C. Russ, Rita Rooyackers

المصدر: IEEE Transactions on Electron Devices. 55:3507-3516

مصطلحات موضوعية: Electrostatic discharge, Materials science, business.industry, Electronic, Optical and Magnetic Materials, Human-body model, Semiconductor, Nanoelectronics, Transmission line, MOSFET, Electronic engineering, Optoelectronics, Sensitivity (control systems), Electrical and Electronic Engineering, business, Extrinsic semiconductor

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::87e8c16eccf2bd2b12da7352031b34ce
https://doi.org/10.1109/ted.2008.2006547

المؤلفون: Andrea Cester, Simone Gerardin, Gabriella Ghidini, Alessandro Paccagnella, Alessio Griffoni

المصدر: Microelectronics Reliability. 46:1669-1672

مصطلحات موضوعية: Materials science, law.invention, Circuit reliability, Stress (mechanics), law, Gate oxide, MOSFET, Electrical Stress, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, Voltage converter, business.industry, Transistor, Electrical engineering, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Oxide Reliability, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, CMOS, Optoelectronics, Inverter, business, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8ad73c67c08e2695dd1e4aeb33aa7d57
https://doi.org/10.1016/j.microrel.2006.07.052

المؤلفون: Alessio Griffoni, Franco Zanon, Xiaolong Li, Geert Willems, Bart Vandevelde, Matteo Meneghini

مصطلحات موضوعية: Reliability (semiconductor), Materials science, business.industry, Soldering, Fracture (geology), Fracture mechanics, Temperature cycling, Structural engineering, business, Joint (geology), Finite element method, Fem simulations

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0b31d814ad67be14c43ea5b024ff4966
http://hdl.handle.net/11577/3183747

المؤلفون: Marco Barbato, S. Vaccari, M. La Grassa, Alessio Griffoni, Gaudenzio Meneghesso, S. Carraro, Enrico Zanoni, Diego Barbisan, Matteo Meneghini

مصطلحات موضوعية: Materials science, Light emitting diodes, Electrostatic discharge (ESD), Failure Mechanisms, business.industry, Optical power, Failure mechanism, Condensed Matter Physics, Chip, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Robustness (computer science), law, Transmission line, RGB color model, Optoelectronics, Electrical and Electronic Engineering, Gradual increase, Safety, Risk, Reliability and Quality, business, Light-emitting diode

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ee250ee457ba36c164b7b97b55123e9e
http://hdl.handle.net/11577/2693096

المؤلفون: Cor Claeys, N. N. Mahatme, Ronald D. Schrimpf, Joao Antonio Martino, Paula Ghedini Der Agopian, Marc Aoulaiche, Daisuke Kobayashi, Alessio Griffoni, Robert A. Reed, Eddy Simoen

المصدر: 2012 IEEE International SOI Conference (SOI).

مصطلحات موضوعية: Planar, Materials science, business.industry, Absorbed dose, MOSFET, Electrical engineering, Nanowire, Silicon on insulator, Double gate, business, Engineering physics, Radiation hardening, Buried oxide

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fb4abaf44d5965b3eef8fecfff0c0c54
https://doi.org/10.1109/soi.2012.6404372

المؤلفون: Luigi Carro, Ronaldo Rodrigues Ferreira, Paolo Rech, C. Frost, Alessio Griffoni, C. Aguiar, Marco Silvestri

المصدر: 2012 IEEE Radiation Effects Data Workshop.

مصطلحات موضوعية: Instruction set, Cross section (physics), Computer science, Single event upset, Internal memory, Neutron, Parallel computing, Sensitivity (control systems), Radiation, Matrix multiplication, Computational science

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::715681a06a9097a7c329d4e23a139f46
https://doi.org/10.1109/redw.2012.6353714

المؤلفون: Dimitri Linten, Alessio Griffoni, Eddy Simoen, Malgorzata Jurczak, Bharat L. Bhuva, Ronald D. Schrimpf, N. N. Mahatme, Marc Aoulaiche, Guido Groeseneken, Robert A. Reed

المصدر: 2012 IEEE International Reliability Physics Symposium (IRPS).

مصطلحات موضوعية: Materials science, business.industry, Transistor, equipment and supplies, Body memory, law.invention, Threshold voltage, law, Logic gate, Absorbed dose, MOSFET, Optoelectronics, business, Leakage (electronics), Floating body effect

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b846113f70d5bdf6e65bfca2e9364273
https://doi.org/10.1109/irps.2012.6241920

المؤلفون: Patrick Girard, Paolo Rech, Frédéric Wrobel, Alessio Griffoni, Luigi Dilillo, Jerome Boch, Frédéric Saigné, Jean-Marc Galliere

المساهمون: Conception et Test de Systèmes MICroélectroniques (SysMIC), Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM), Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM), IMEC (IMEC), Catholic University of Leuven - Katholieke Universiteit Leuven (KU Leuven), Institut d’Electronique et des Systèmes (IES), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Radiations et composants (RADIAC), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)

المصدر: IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2012, 59 (4), pp.893-899. ⟨10.1109/TNS.2012.2187218⟩

مصطلحات موضوعية: 010302 applied physics, Physics, Nuclear and High Energy Physics, Random access memory, 010308 nuclear & particles physics, Nuclear engineering, soft error rate, SRAM, 01 natural sciences, [SPI.TRON]Engineering Sciences [physics]/Electronics, MBus, Nuclear Energy and Engineering, Error analysis, 0103 physical sciences, Memory architecture, Electronic engineering, Multiple bit upset, Neutron, Static random-access memory, Electrical and Electronic Engineering, Dynamic stress

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3ff71ded4d366eb24453ef7cf17c9a5f
https://hal-lirmm.ccsd.cnrs.fr/lirmm-00805031

المؤلفون: Patrick Verbist, Jeroen van Duivenbode, Eddy Simoen, Dimitri Linten, Luigi Dilillo, Alessio Griffoni, Frédéric Wrobel, Paolo Rech, Guido Groeseneken

المساهمون: Electromechanics and Power Electronics, IMEC (IMEC), Catholic University of Leuven - Katholieke Universiteit Leuven (KU Leuven), Eindhoven University of Technology [Eindhoven] (TU/e), IMEC, Catholic University of Leuven - Katholieke Universiteit Leuven (KU Leuven)-Catholic University of Leuven - Katholieke Universiteit Leuven (KU Leuven), Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM), Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM), Conception et Test de Systèmes MICroélectroniques (SysMIC), Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM), Radiations et composants (RADIAC), Institut d’Electronique et des Systèmes (IES), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)

المصدر: IEEE Transactions on Nuclear Science, 59(4), 866-871. Institute of Electrical and Electronics Engineers
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2012, 59 (4), pp.866-871. ⟨10.1109/TNS.2011.2180924⟩

مصطلحات موضوعية: silicon carbide (SiC), Nuclear and High Energy Physics, Materials science, Silicon, single event gate rupture (SEGR), Gate dielectric, Nuclear Theory, chemistry.chemical_element, 01 natural sciences, chemistry.chemical_compound, Gate oxide, 0103 physical sciences, Silicon carbide, Power semiconductor device, Silicon bandgap temperature sensor, Electrical and Electronic Engineering, Power MOSFET, Insulated gate bipolar transistor (IGBT), Nuclear Experiment, 010302 applied physics, power MOSFET, 010308 nuclear & particles physics, business.industry, neutrons, Electrical engineering, Insulated-gate bipolar transistor, [SPI.TRON]Engineering Sciences [physics]/Electronics, Nuclear Energy and Engineering, chemistry, single event burnout (SEB), super-junction, Optoelectronics, Physics::Accelerator Physics, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::211849fb6bba612e8b6efb56fc39af22
https://research.tue.nl/nl/publications/e7d1d4cb-67ce-420f-a768-d1d130dabb3b