نتائج البحث - "Akinobu Teramoto"

1

Academic Journal

Interface analysis of oxide free MoS2 films fabricated by solution process

المؤلفون: Md Iftekharul Alam, Rikiya Sumichika, Junichi Tsuchimoto, Tadahiro Komeda, Akinobu Teramoto

المصدر: Scientific Reports, Vol 14, Iss 1, Pp 1-13 (2024)

مصطلحات موضوعية: Transitional metal dichalcogenides, MoS2, Oxide-free surface, Thermal desorption spectroscopy, Interface analysis, Medicine, Science

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2045-2322

URL الوصول: https://doaj.org/article/766235ed461f47b3bce90753dffde780

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2

Academic Journal

[Paper] High-Resolution Defect Detection for Flat Panel Display Using Proximity Capacitance Image Sensor

المؤلفون: Akinobu Teramoto, Hiroshi Hamori, Kazuhisa Kobayashi, Rihito Kuroda, Shigetoshi Sugawa, Toshiro Yasuda, Yayoi Yokomichi

المصدر: ITE Transactions on Media Technology and Applications. 2023, 11(4):158

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3

Academic Journal

Large-Scale Evaluation of MIM Devices Using High-Precision Current Measurement Array Test Circuit / 高精度電流計測アレイテスト回路を用いたMIM素子の大規模測定

المؤلفون: Akinobu Teramoto, Hayato Suzuki, Hyeonwoo Park, Rihito Kuroda, Shigetoshi Sugawa, Tomoyuki Suwa, 寺本章伸, 朴賢雨, 諏訪智之, 鈴木勇人, 須川成利, 黒田理人

المصدر: JSAP Annual Meetings Extended Abstracts. 2020, :2717

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4

Academic Journal

[Papers] Impacts of Random Telegraph Noise with Various Time Constants and Number of States in Temporal Noise of CMOS Image Sensors

المؤلفون: Akinobu Teramoto, Rihito Kuroda, Shigetoshi Sugawa

المصدر: ITE Transactions on Media Technology and Applications. 2018, 6(3):171

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5

Academic Journal

[Papers] Statistical Analyses of Random Telegraph Noise in Pixel Source Follower with Various Gate Shapes in CMOS Image Sensor

المؤلفون: Akinobu Teramoto, Rihito Kuroda, Shigetoshi Sugawa, Shinya Ichino, Shunichi Wakashima, Takezo Mawaki, Tomoyuki Suwa

المصدر: ITE Transactions on Media Technology and Applications. 2018, 6(3):163

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6

Academic Journal

Effects of Oxygen Microbubbles on Photoresist Layers under Hot Water Conditions

المؤلفون: Akinobu Teramoto, Hideo Horibe, Katsumi Tatera, Kouhei Matsuura, Masayoshi Takahashi, Tunejirou Takahashi, Yasuyuki Shirai

المصدر: Journal of Photopolymer Science and Technology. 2016, 29(4):643

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7

Academic Journal

Statistical analysis of random telegraph noise in pixel source follower ~Impacts of transistor shape, time constants and number of states~ / 画素SFで発生するランダムテレグラフノイズの統計的解析～トランジスタ形状・時定数・遷移数の影響～

المؤلفون: Akinobu TERAMOTO, Rihito KURODA, Shigetoshi SUGAWA, Shinya ICHINO, Shunichi WAKASHIMA, Takezo MAWAKI, 寺本章伸, 市野真也, 若嶋駿一, 間脇武蔵, 須川成利, 黒田理人

المصدر: ITE Technical Report. 2017, :13

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8

Academic Journal

Effect of random telegraph noise reduction by atomically flat gate insulator film/Si interface / ゲート絶縁膜/Si界面の原子オーダー平坦化によるランダムテレグラフノイズ低減効果(高機能イメージセンシングとその応用)

المؤلفون: Akinobu TERAMOTO, Daiki KIMOTO, Naoya AKAGAWA, Rihito KURODA, Shigetoshi SUGAWA, Tetsuya GOTO, Toshiki OBARA, 寺本章伸, 小原俊樹, 後藤哲也, 木本大幾, 赤川直也, 須川成利, 黒田理人

المصدر: ITE Technical Report. 2015, :35

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9

Academic Journal

Evaluation of short range order in SiO2 thin-film by grazing-incidence wide and small-angle X-ray scattering / 微小角入射X線小角散乱及び広角散乱によるSiO2薄膜中の短距離秩序性の評価

المؤلفون: Akinobu Teramoto, Atsushi Ogura, Hiroki Tokutake, Ichiro Hirosawa, Kohki Nagata, Masaya Nagasaka, Tadahiro Ohmi, Takeo Hattori, Tomoyuki Suwa, 大見忠弘, 寺本章伸, 小椋厚志, 廣沢一郎, 徳武寛紀, 服部健雄, 永田晃基, 諏訪智之, 長坂将也

المصدر: JSAP Annual Meetings Extended Abstracts. 2014, :2698

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10

Academic Journal

A Statistical Analysis of Dependencies of Random Telegraph Noise Time Constants on Operation Conditions / ランダムテレグラフノイズ時定数の動作条件依存性の統計的解析(固体撮像技術および一般)

المؤلفون: Akihiro YONEZAWA, Akinobu TERAMOTO, Rihito KURODA, Shigetoshi SUGAWA, Toshiki OBARA, 寺本章伸, 小原俊樹, 米澤彰浩, 須川成利, 黒田理人

المصدر: ITE Technical Report. 2014, :15

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11

Academic Journal

A Statistical Evaluation of Random Telegraph Noise of In-pixel Source Follower Equivalent Buried and Surface Channel Transistors / 画素ソースフォロワ相当の埋め込み・表面チャネルトランジスタのランダム・テレグラフ・ノイズ統計的解析(固体撮像技術および一般～IEDM, SPIE EI, ISSCC特集～)

المؤلفون: Akihiro YONEZAWA, Akinobu TERAMOTO, Rihito KURODA, Shigetoshi SUGAWA, Tsung-Ling LI, Yasuhisa TOCHIGI, 寺本章伸, 李宗霖, 栃木靖久, 米澤彰浩, 須川成利, 黒田理人

المصدر: ITE Technical Report. 2013, :19

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12

Academic Journal

Tribological Study of Direct-polish Process on Non-porous Ultra Low-k Dielectric / Cu Interconnects / 次世代LSI向け低誘電率絶縁膜/Cuダマシン配線形成へのダイレクトポリッシング技術の応用

المؤلفون: Akinobu Teramoto, GU XUN, Shigetoshi Sugawa, Shin-Ichiro Kuroki, Tadahiro Ohmi, Takenao Nemoto, Xun Gu, Yugo Tomita, 大見忠弘, 富田祐吾, 寺本章伸, 根本剛直, 須川成利, 黒木伸一朗

المصدر: Proceedings of JSPE Semestrial Meeting. 2010, :133

13

Academic Journal

Optimization of brush scrubbing condition on Cu/low-k damascene structure by using pressure sensing sheet / 圧力測定シートを用いた低誘電率絶縁膜／Cuダマシン配線形成プロセス中のブラシ洗浄条件最適化

المؤلفون: Akinobu Teramoto, Gu Xun, Shigetoshi Sugawa, Tadahiro Ohmi, Takenao Nemoto, 大見忠弘, 寺本章伸, 根本剛直, 谷クン, 須川成利

المصدر: Proceedings of JSPE Semestrial Meeting. 2010, :715

14

Academic Journal

Formation of High Quality Silicon Nitride Films using Microwave Excitation Plasma / マイクロ波励起プラズマを用いた高品質シリコン窒化膜の形成

المؤلفون: Akinobu TERAMOTO, Eiji IKENAGA, Masaaki HIGUCHI, Masaki HIRAYAMA, Shigetoshi SUGAWA, Tadahiro OHMI, Takashi ARATANI, Takeo HATTORI, 大見忠弘, 寺本章伸, 平山昌樹, 服部健雄, 樋口正顕, 池永英司, 荒谷崇, 須川成利

المصدر: 真空 / Shinku. 2007, 50(11):659

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15

Academic Journal

X-ray Photoelectron Spectroscopic Study of Nitrogen Depth Profile in Radical Nitrided Silicon Oxynitride Film / ラジカル窒化シリコン酸窒化膜における窒素プロファイルのX 線光電子分光分析による評価

المؤلفون: Akinobu TERAMOTO, Hiroshi UMEDA, Kazumasa KAWASE, Masao INOUE, Tadahiro OHMI, Takeo HATTORI, Tomoyuki SUWA, 井上真雄, 大見忠弘, 寺本章伸, 服部健雄, 梅田浩司, 河瀬和雅, 諏訪智之

المصدر: 真空 / Shinku. 2007, 50(11):672

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16

Academic Journal

Ultra-Clean-Technology for Future Semiconductor Fabrication Fluctuation Free Semiconductor Manufacturing / 次世代半導体プロセスにおけるウルトラクリーンテクノロジー

المؤلفون: Akinobu TERAMOTO, Tadahiro OHMI, 大見忠弘, 寺本章伸

المصدر: 精密工学会誌 / Journal of the Japan Society for Precision Engineering. 2002, 68(9):1144

17

Academic Journal

RTN測定の高精度化・高速化技術とRTN特性に強い影響度を示すプロセス条件(携帯電話用カメラ,デジタルスチルカメラ,ビデオカメラ(ハイビジョン)とそのためのイメージセンサ,モジュール,特別企画「CCD誕生40周年記念講演-黎明期-」) / Techniques for high accurate and fast measurement of RTN and fabrication process conditions having a strong influence on RTN characteristics

المؤلفون: Akinobu TERAMOTO, Kenichi ABE, Shigetoshi SUGAWA, Tadahiro OHMI, 大見忠弘, 寺本章伸, 阿部健一, 須川成利

المصدر: ITE Technical Report. 2010, :29

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18

Academic Journal

Mesoscopic-Scale and Small Strain Field beneath SiO2/Si Interface Revealed by a Multiple-Wave X-ray Diffraction Phenomenon — Depth of the Strain Field

المؤلفون: Akinobu Teramoto, Kazushi Miki, Takeo Hattori, Toshio Takahashi, Wataru Yashiro, Yoshitaka Yoda

المصدر: e-Journal of Surface Science and Nanotechnology. 2011, 9:47

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19

Academic Journal

Data Analysis Technique of Atomic Force Microscopy for Atomically Flat Silicon Surfaces

المؤلفون: Akinobu TERAMOTO, Masahiro KONDA, Rihito KURODA, Tadahiro OHMI, Tomoyuki SUWA

المصدر: IEICE Transactions on Electronics. 2009, E92.C(5):664

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20

Academic Journal

Quantitative Analysis of the Strain Field beneath the Si3N4/Si(001) Interface Formed by the Xe/NH3 Plasma Nitridation using a Multiple-Wave X-ray Diffraction Phenomenon

المؤلفون: Akinobu Teramoto, Kazushi Miki, Takashi Aratani, Takeo Hattori, Wataru Yashiro, Yoshitaka Yoda

المصدر: Transactions of the Materials Research Society of Japan. 2009, 34(4):597

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