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1Academic Journal
المؤلفون: Grzegorz Cios, Aimo Winkelmann, Tomasz Tokarski, Piotr Bała
المصدر: Communications Earth & Environment, Vol 5, Iss 1, Pp 1-3 (2024)
مصطلحات موضوعية: Geology, QE1-996.5, Environmental sciences, GE1-350
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2662-4435
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2Academic Journal
المؤلفون: Wilder Carrillo-Cabrera, Paul Simon, Marcus Schmidt, Markus König, Horst Borrmann, Aimo Winkelmann, Ulrich Burkhardt, Yuri Grin
المصدر: Communications Materials, Vol 4, Iss 1, Pp 1-9 (2023)
مصطلحات موضوعية: Materials of engineering and construction. Mechanics of materials, TA401-492
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2662-4443
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3Academic Journal
المصدر: Materials; Volume 15; Issue 19; Pages: 6653
مصطلحات موضوعية: martensite transformation, martensite tetragonality, atom probe tomography, electron backscatter diffraction
وصف الملف: application/pdf
Relation: Metals and Alloys; https://dx.doi.org/10.3390/ma15196653
الاتاحة: https://doi.org/10.3390/ma15196653
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4Academic Journal
المؤلفون: Yongtao Liu (5518235), Patrick Trimby (465930), Liam Collins (1650991), Mahshid Ahmadi (1991158), Aimo Winkelmann (2618647), Roger Proksch (2293282), Olga S. Ovchinnikova (1612099)
مصطلحات موضوعية: Biophysics, Biotechnology, Developmental Biology, Biological Sciences not elsewhere classified, Chemical Sciences not elsewhere classified, Physical Sciences not elsewhere classified, ferroic, out-of-plane PFM measurements, MHPs optoelectronic properties, piezoresponse force microscopy, EBSD, CH 3 NH 3 PbI 3 PFM results, CH 3 NH 3 PbI 3 sample, electron backscatter diffraction, orientation, CH 3 NH 3 PbI 3, Metal Halide Perovskites Metal hali., stripe, PFM signal
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5Academic Journal
المؤلفون: Aimo Winkelmann, Gert Nolze, Grzegorz Cios, Tomasz Tokarski, Piotr Bała
المصدر: Materials; Volume 13; Issue 12; Pages: 2816
مصطلحات موضوعية: scanning electron microscopy, electron backscatter diffraction, Kikuchi diffraction, projection center, orientation precision
وصف الملف: application/pdf
Relation: https://dx.doi.org/10.3390/ma13122816
الاتاحة: https://doi.org/10.3390/ma13122816
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6
المؤلفون: Olena Fedchenko, Aimo Winkelmann, Gerd Schönhense
المصدر: Journal of the Physical Society of Japan 91(9), 091006 (2022). doi:10.7566/JPSJ.91.091006
مصطلحات موضوعية: Condensed Matter - Materials Science, Materials Science (cond-mat.mtrl-sci), FOS: Physical sciences, General Physics and Astronomy, ddc:530
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7
المؤلفون: Yongtao Liu, Liam Collins, Patrick Trimby, Aimo Winkelmann, Olga S. Ovchinnikova, Mahshid Ahmadi, Roger Proksch
المصدر: ACS Nano. 15:7139-7148
مصطلحات موضوعية: Materials science, General Engineering, General Physics and Astronomy, 02 engineering and technology, 010402 general chemistry, 021001 nanoscience & nanotechnology, 01 natural sciences, Ferroelectricity, Piezoelectricity, Displacement (vector), 0104 chemical sciences, Crystallography, Piezoresponse force microscopy, General Materials Science, Grain boundary, Facet, 0210 nano-technology, Electron backscatter diffraction, Perovskite (structure)
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8
المؤلفون: Aimo Winkelmann, Gert Nolze, Grzegorz Cios, Tomasz Tokarski
المصدر: Journal of Applied Crystallography
مصطلحات موضوعية: Hilton net, Diffraction, EBSD, Phase (waves), 02 engineering and technology, gnomonic projections, 01 natural sciences, General Biochemistry, Genetics and Molecular Biology, Gnomonic projection, Optics, Position (vector), 0103 physical sciences, electron backscatter diffraction, Projection (set theory), UVW mapping, 010302 applied physics, Physics, Kikuchi patterns, business.industry, Plane (geometry), 021001 nanoscience & nanotechnology, Research Papers, angle measurement, 0210 nano-technology, business, Electron backscatter diffraction
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9
المؤلفون: Etienne Brodu, Aimo Winkelmann, Marc Seefeldt
المصدر: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada.
مصطلحات موضوعية: Instrumentation
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10
المؤلفون: Thomas Kohne, Tuerdi Maimaitiyili, Aimo Winkelmann, Emad Maawad, Peter Hedström, Annika Borgenstam
المصدر: Metallurgical and materials transactions / A 53(8), 3034-3043 (2022). doi:10.1007/s11661-022-06724-z
Kohne, T.; Maimaitiyili, T.; Winkelmann, A.; Maawad, E.; Hedström, P.; Borgenstam, A.: Early Martensitic Transformation in a 0.74C–1.15Mn–1.08Cr High Carbon Steel. In: Metallurgical and Materials Transactions A. Vol. 53 (2022) 8, 3034-3043. (DOI: /10.1007/s11661-022-06724-z)مصطلحات موضوعية: Mechanics of Materials, Metals and Alloys, ddc:530, Condensed Matter Physics
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11
المؤلفون: Aimo Winkelmann, Grzegorz Cios, Tomasz Tokarski, Piotr Bała, Yuri Grin, Ulrich Burkhardt
المصدر: Materials Characterization. 196:112633
مصطلحات موضوعية: Mechanics of Materials, Mechanical Engineering, General Materials Science, Condensed Matter Physics
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12
المؤلفون: Pat Trimby, Kim Larsen, Michael Hjelmstad, Aimo Winkelmann, Klaus Mehnert
المصدر: Microscopy and Microanalysis. 28:3182-3183
مصطلحات موضوعية: Instrumentation
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13
المؤلفون: Grzegorz Cios, Piotr Bała, Gert Nolze, Aimo Winkelmann, Carol Trager-Cowan, Ben Hourahine, Tomasz Tokarski
مصطلحات موضوعية: Diffraction, Physics, Histology, Electron, Projection (linear algebra), Pathology and Forensic Medicine, Computational physics, Electron diffraction, Phenomenological model, RA1001, Kikuchi line, Order of magnitude, QC, Electron backscatter diffraction
وصف الملف: application/pdf
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14
المؤلفون: Vivian Tong, B.M. Jablon, Aimo Winkelmann, Ken Mingard, Carol Trager-Cowan
المصدر: Journal of Microscopy. 277:79-92
مصطلحات موضوعية: 0303 health sciences, Histology, Materials science, Pixel, business.industry, Orientation (computer vision), Detector, Resolution (electron density), 02 engineering and technology, 021001 nanoscience & nanotechnology, Pathology and Forensic Medicine, 03 medical and health sciences, Optics, Feature (computer vision), Pattern matching, 0210 nano-technology, business, Image resolution, QC, 030304 developmental biology, Electron backscatter diffraction
وصف الملف: application/pdf
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15
المؤلفون: Tomasz Tokarski, Gert Nolze, Grzegorz Cios, Łukasz Rychłowski, Aimo Winkelmann
مصطلحات موضوعية: Diffraction, Physics, Lattice (module), Reciprocal lattice, Lattice constant, Crystal system, Bravais lattice, Kikuchi line, QC, General Biochemistry, Genetics and Molecular Biology, Computational physics, Electron backscatter diffraction
وصف الملف: application/pdf
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16
المؤلفون: Grzegorz Cios, Łukasz Rychłowski, Gert Nolze, Piotr Bała, Tomasz Tokarski, Aimo Winkelmann
المصدر: Ultramicroscopy. 230
مصطلحات موضوعية: Diffraction, Materials science, Scanning electron microscope, business.industry, Noise (signal processing), Dynamic range, Spectral density, Signal, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Optics, Signal-to-noise ratio, business, Instrumentation, Electron backscatter diffraction
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17
المؤلفون: Andrei Gloskovskii, Yu. Matveyev, O. Fedchenko, M. H. Schmitt, S. Chernov, D. Vasilyev, Gerd Schönhense, S. Babenkov, L. Dudy, Aimo Winkelmann, Christoph Schlueter, Michael Sing, Ralph Claessen, Ozan Kirilmaz, Katerina Medjanik, H. J. Elmers
المصدر: Physical review / B 104(4), 045129 (1-10) (2021). doi:10.1103/PhysRevB.104.045129
مصطلحات موضوعية: Materials science, Condensed matter physics, Spintronics, Spin polarization, Photoemission spectroscopy, Fermi level, Polarization (waves), chemistry.chemical_compound, symbols.namesake, Condensed Matter::Materials Science, X-ray photoelectron spectroscopy, chemistry, symbols, ddc:530, Spin (physics), Magnetite
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18
المؤلفون: Katerina Medjanik, Aimo Winkelmann, Hans-Joachim Elmers, Maciej Sawicki, O. Fedchenko, L. Gluba, O. Yastrubchak, Janusz Sadowski, S. Chernov, D. Vasilyev, Gerd Schönhense, S. Babenkov
المصدر: Physical review / B 103(7), 075107 (2021). doi:10.1103/PhysRevB.103.075107
مصطلحات موضوعية: Diffraction, Materials science, Condensed matter physics, business.industry, Point reflection, Fermi level, 02 engineering and technology, Magnetic semiconductor, Electronic structure, 021001 nanoscience & nanotechnology, 01 natural sciences, symbols.namesake, Condensed Matter::Materials Science, Semiconductor, Ferromagnetism, 0103 physical sciences, symbols, ddc:530, 010306 general physics, 0210 nano-technology, Electronic band structure, business
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19
المصدر: Journal of Applied Crystallography
مصطلحات موضوعية: lattice parameters, Kikuchi patterns, Physics::Optics, electron backscatter diffraction, Computer Programs, Radon transform
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20
المؤلفون: Horst Borrmann, Ulrich Burkhardt, Markus König, Yuri Grin, Andreea Dumitriu, Grzegorz Cios, Aimo Winkelmann
المصدر: Science Advances
مصطلحات موضوعية: Diffraction, Materials science, High Energy Physics::Lattice, Materials Science, Phase (waves), Physics::Optics, 02 engineering and technology, Electron, 010403 inorganic & nuclear chemistry, 01 natural sciences, Physics::Atmospheric and Oceanic Physics, Research Articles, Multidisciplinary, Chemical Physics, High Energy Physics::Phenomenology, SciAdv r-articles, 021001 nanoscience & nanotechnology, 0104 chemical sciences, Crystallography, Enantiopure drug, Nonlinear Sciences::Exactly Solvable and Integrable Systems, Electron diffraction, Crystallite, 0210 nano-technology, Chirality (chemistry), Kikuchi line, Research Article