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1Academic JournalThe analysis of soft error in static random access memory and mitigation by using transmission gate.
المؤلفون: Abdul Kadir, Farhana Mohamad, Julai, Norhuzaimin
المصدر: Bulletin of Electrical Engineering & Informatics; Dec2024, Vol. 13 Issue 6, p3983-3992, 10p
مصطلحات موضوعية: STATIC random access memory, COMPLEMENTARY metal oxide semiconductors, SOFT errors, MOORE'S law, DATA corruption