المؤلفون: Freitas Jr., Jaime A.¹ (AUTHOR) jaime.a.freitas.civ@us.navy.mil, Culbertson, James C.¹ (AUTHOR), Storm, David F.¹ (AUTHOR), Mahadik, Nadeemullah A.¹ (AUTHOR), Nepal, Neeraj¹ (AUTHOR), Anderson, Travis J.¹ (AUTHOR)

المصدر: Journal of Applied Physics. 1/21/2025, Vol. 137 Issue 3, p1-9. 9p.

مصطلحات موضوعية: *ATOMIC force microscopy, *SUBSTRATES (Materials science), *X-ray diffraction measurement, *RAMAN microscopy, *RAMAN scattering

المؤلفون: Abram, Ester^1,2 (AUTHOR) E.Abram@arcnl.nl, Orlov, Nikolai³ (AUTHOR), Garnett, Erik C.^2,3 (AUTHOR), Planken, Paul^1,2 (AUTHOR)

المصدر: Journal of Applied Physics. 12/28/2024, Vol. 136 Issue 24, p1-14. 14p.

مصطلحات موضوعية: *ATOMIC force microscopy, *ALUMINUM forming, *FEMTOSECOND pulses, *LIGHT sources, *SEMICONDUCTOR devices

المؤلفون: Wang, Yukun¹ (AUTHOR) hyf@jsut.edu.cn, Hu, Yifeng^1,2 (AUTHOR)

المصدر: Journal of Chemical Physics. 8/28/2024, Vol. 161 Issue 8, p1-9. 9p.

مصطلحات موضوعية: *ATOMIC force microscopy, *TRANSMISSION electron microscopy, *TRANSITION temperature, *SUBSTRATES (Materials science), *THIN films

المؤلفون: Yang, Rui¹ (AUTHOR), Cui, Yi¹ (AUTHOR), Yang, Zicong¹ (AUTHOR), Qin, Feng¹ (AUTHOR), Rao, Junhao¹ (AUTHOR), Yuan, Hongtao¹ (AUTHOR), Qiu, Caiyu¹ (AUTHOR) qiucy@nju.edu.cn

المصدر: Journal of Applied Physics. 8/14/2024, Vol. 136 Issue 6, p1-9. 9p.

مصطلحات موضوعية: *ATOMIC force microscopy, *STRAINS & stresses (Mechanics), *MECHANICAL engineering, *ELECTRONIC modulation, *TRANSITION metals

المؤلفون: Omar, Hassan¹ (AUTHOR), Ahamadi, Shayan¹ (AUTHOR), Hülagü, Deniz¹ (AUTHOR), Hidde, Gundula¹ (AUTHOR), Hertwig, Andreas¹ (AUTHOR), Szymoniak, Paulina¹ (AUTHOR), Schönhals, Andreas^1,2 (AUTHOR) Andreas.Schoenhals@bam.de

المصدر: Journal of Chemical Physics. 8/7/2024, Vol. 161 Issue 5, p1-12. 12p.

مصطلحات موضوعية: *GLASS transition temperature, *ATOMIC force microscopy, *GLASS transitions, *SUBSTRATES (Materials science), *THIN films

المؤلفون: Scales, Ze F.^1,2 (AUTHOR) ze.scales@k-ai.at, Koller, Christian³ (AUTHOR), Lymperakis, Liverios^4,5 (AUTHOR), Nelhiebel, Michael¹ (AUTHOR), Stoeger-Pollach, Michael² (AUTHOR)

المصدر: Journal of Applied Physics. 7/28/2024, Vol. 136 Issue 4, p1-11. 11p.

مصطلحات موضوعية: *SCANNING transmission electron microscopy, *ATOMIC force microscopy, *POWER semiconductors, *DOPING agents (Chemistry), *DENSITY functional theory, *ELECTRON energy loss spectroscopy

المؤلفون: Yanagisawa, Ryo¹ (AUTHOR), Ueda, Tadashi² (AUTHOR), Nakamoto, Kei-ichi² (AUTHOR), Lu, Zhengxi¹ (AUTHOR), Onishi, Hiroshi^1,2 (AUTHOR) oni@kobe-u.ac.jp, Minato, Taketoshi² (AUTHOR) minato@ims.ac.jp

المصدر: Journal of Chemical Physics. 7/14/2024, Vol. 161 Issue 2, p1-5. 5p.

مصطلحات موضوعية: *ATOMIC force microscopy, *ORGANIC solvents, *YOUNG'S modulus, *SURFACE phenomenon, *SURFACE roughness

المؤلفون: Cianci, Salvatore¹ (AUTHOR), Blundo, Elena¹ (AUTHOR) elena.blundo@uniroma1.it, Tuzi, Federico¹ (AUTHOR), Cecchetti, Daniele² (AUTHOR), Pettinari, Giorgio² (AUTHOR), Felici, Marco¹ (AUTHOR), Polimeni, Antonio¹ (AUTHOR) antonio.polimeni@uniroma1.it

المصدر: Journal of Applied Physics. 6/28/2024, Vol. 135 Issue 24, p1-6. 6p.

مصطلحات موضوعية: *TRANSITION metals, *ATOMIC force microscopy, *SEMICONDUCTOR materials, *TRANSITION metal alloys, *ENGINEERING

المؤلفون: Weber, Jonas

المساهمون: University/Department: Universitat de Barcelona. Facultat de Física

Thesis Advisors: Lanza, Mario, Fernández Pradas, Juan Marcos

المصدر: TDX (Tesis Doctorals en Xarxa)

مصطلحات موضوعية: Microscòpia de força atòmica, Microscopía de fuerza atómica, Atomic force microscopy, Ciències Experimentals i Matemàtiques

وصف الملف: application/pdf

URL الوصول: http://hdl.handle.net/10803/690847

المؤلفون: Olcay, Emir Suad¹ (AUTHOR), Sönmez, Ayşe¹ (AUTHOR), Okumuş, Esra^1,2 (AUTHOR), Çolakerol Arslan, Leyla¹ (AUTHOR), Berber, Savaş¹ (AUTHOR), Seyidov, MirHasan Yu.¹ (AUTHOR) smirhasan@gtu.edu.tr

المصدر: Journal of Applied Physics. 5/28/2024, Vol. 135 Issue 20, p1-21. 21p.

مصطلحات موضوعية: *ATOMIC force microscopy techniques, *ELECTRODIFFUSION, *SEMICONDUCTOR defects, *ELECTRIC fields, *SEMICONDUCTORS, *SURFACE reconstruction

المؤلفون: Franceschi, Giada¹ (AUTHOR) franceschi@iap.tuwien.ac.at, Conti, Andrea¹ (AUTHOR), Lezuo, Luca¹ (AUTHOR), Abart, Rainer² (AUTHOR), Mittendorfer, Florian¹ (AUTHOR), Schmid, Michael¹ (AUTHOR), Diebold, Ulrike¹ (AUTHOR)

المصدر: Journal of Chemical Physics. 4/28/2024, Vol. 160 Issue 16, p1-8. 8p.

مصطلحات موضوعية: *X-ray photoelectron spectroscopy, *ATOMIC force microscopy, *ADSORPTION (Chemistry)

المؤلفون: Mathews Jr., M. A.¹ (AUTHOR), Graves, A. R.¹ (AUTHOR), Boris, D. R.² (AUTHOR), Walton, S. G.² (AUTHOR), Stinespring, C. D.¹ (AUTHOR)

المصدر: Journal of Applied Physics. 4/21/2024, Vol. 135 Issue 15, p1-11. 11p.

مصطلحات موضوعية: *X-ray photoelectron spectroscopy, *ATOMIC force microscopy, *ATOMIC spectroscopy, *HYDROFLUORIC acid, *SURFACE defects

المؤلفون: Tanoue, Koki, Ishii, Hisao, Marsters, Celena L., Roberts, Sean T., Miyamae, Takayuki

المصدر: Journal of Chemical Physics; 1/7/2025, Vol. 162 Issue 1, p1-10, 10p

مصطلحات موضوعية: ORGANIC field-effect transistors, PHOTON upconversion, ATOMIC force microscopy, ELECTRONIC equipment, MOLECULAR orientation

المؤلفون: Guo, Jianli, Egawa, Satoru, Motoyama, Hiroto, Mimura, Hidekazu

المصدر: Journal of Applied Physics; 1/7/2025, Vol. 137 Issue 1, p1-10, 10p

مصطلحات موضوعية: CHEMICAL processes, SILICON surfaces, ATOMIC force microscopy, CHEMICAL reactions, CHEMICAL properties

المؤلفون: Millán Solsona, Rubén

المساهمون: University/Department: Universitat de Barcelona. Facultat de Física

Thesis Advisors: Gomila Lluch, Gabriel

المصدر: TDX (Tesis Doctorals en Xarxa)

مصطلحات موضوعية: Microscòpia de força atòmica, Microscopía de fuerza atómica, Atomic force microscopy, Nanoestructures, Nanoestructuras, Nanostructures, Bioenginyeria, Bioingeniería, Bioengineering, Electroestàtica, Electrostática, Electrostatics, Ciències Experimentals i Matemàtiques

وصف الملف: application/pdf

URL الوصول: http://hdl.handle.net/10803/688862

المصدر: Chemistry & Industry. Oct2024, Vol. 88 Issue 10, p30-33. 4p.

مصطلحات موضوعية: *CHOCOLATE industry, FOOD emulsifiers, ATOMIC force microscopy, LIVER proteins, OLFACTOMETRY, TASTE testing of food

المؤلفون: Yeşilay, Gamze^1,2 gamze.yesilay@sbu.edu.tr

المصدر: Sakarya University Journal of Science (SAUJS) / Sakarya Üniversitesi Fen Bilimleri Enstitüsü Dergisi. Oct2024, Vol. 28 Issue 5, p1086-1092. 7p.

مصطلحات موضوعية: TOPOGRAPHIC maps, ATOMIC force microscopy, GOLD nanoparticles, SURFACE analysis, SURFACE roughness

المؤلفون: Oh, Dong-Won¹ (AUTHOR), Choi, Ji Hoon¹ (AUTHOR), Yu, Gweon Hee¹ (AUTHOR), Kim, Bo Kyung¹ (AUTHOR), Cho, Sang Min¹ (AUTHOR), Choi, Youn Woong¹ (AUTHOR), Jeong, Jin-Hyuk² (AUTHOR), Kang, Ji-Hyun³ (AUTHOR), Kim, Dong-Wook⁴ (AUTHOR) pharmengin@gmail.com, Park, Chun-Woong² (AUTHOR) cwpark@cbnu.ac.kr

المصدر: Pharmaceutical Development & Technology. Nov2024, Vol. 29 Issue 9, p966-975. 10p.

مصطلحات موضوعية: ATOMIC force microscopy techniques, CHRONIC obstructive pulmonary disease, RESPIRATORY therapy, RAMAN microscopy, DRUG interactions, PARTICLE interactions

المؤلفون: Kühn, Nane¹ (AUTHOR) nane.kuehn@tu-braunschweig.de, Frankenberg, Finn¹ (AUTHOR), Kwade, Arno¹ (AUTHOR), Schilde, Carsten¹ (AUTHOR)

المصدر: Journal of Colloid & Interface Science. Feb2025:Part A, Vol. 680, p696-713. 18p.

مصطلحات موضوعية: *ATOMIC force microscopy, *SURFACE energy, *SURFACE roughness, *SURFACE interactions, *ADHESIVES, *PARTICLE interactions

المؤلفون: Sun, Linhao¹ (AUTHOR) sunlinhao0502@se.kanazawa-u.ac.jp, Li, Peiying² (AUTHOR), Chen, Chen^1,3 (AUTHOR) chenchen@elsi.jp

المصدر: Journal of Colloid & Interface Science. Feb2025:Part B, Vol. 679, p435-445. 11p.

مصطلحات موضوعية: *PEPTIDES, *ATOMIC force microscopy, *DISCONTINUOUS precipitation, *MOLECULAR dynamics, *RATE of nucleation, *MOLECULAR recognition