المؤلفون: St J Dixon, Allan

المصدر: BMJ: British Medical Journal, 2004 Jun . 328(7454), 1501-1501.

URL الوصول: https://www.jstor.org/stable/41708067

المؤلفون: Fred Stanke, Oskar Amster, Yongliang Yang, St. J. Dixon-Warren, Benedict Drevniok, Stuart Friedman

المصدر: Microelectronics Reliability. :214-217

مصطلحات موضوعية: 010302 applied physics, Materials science, Calibration curve, business.industry, Doping, Analytical chemistry, 02 engineering and technology, Scanning capacitance microscopy, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Scanning probe microscopy, 0103 physical sciences, Microscopy, Scanning ion-conductance microscopy, Calibration, Optoelectronics, Electrical and Electronic Engineering, 0210 nano-technology, Safety, Risk, Reliability and Quality, business, Microwave

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::40bfc4711a01d5c6313958ac5fd443b9
https://doi.org/10.1016/j.microrel.2017.07.082

المؤلفون: St. J. Dixon-Warren, Oskar Amster, Benedict Drevniok, Fred Stanke, Yongliang Yang, Stuart Friedman

المصدر: 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

مصطلحات موضوعية: 010302 applied physics, Materials science, Dopant, business.industry, Calibration curve, Doping, Analytical chemistry, 02 engineering and technology, Semiconductor device, 021001 nanoscience & nanotechnology, 01 natural sciences, Scanning probe microscopy, Semiconductor, 0103 physical sciences, Microscopy, Calibration, Optoelectronics, 0210 nano-technology, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::689b8e0c40cb0a9e5813a8b2195f0076
https://doi.org/10.1109/ipfa.2017.8060202

المؤلفون: Nilsen, Kjell H., Jayson, Malcolm I. V., St. J. Dixon, Allan

المصدر: The British Medical Journal, 1978 Oct . 2(6145), 1124-1124.

URL الوصول: https://www.jstor.org/stable/25429567

المؤلفون: Burrows, R., Klemperer, Frances, Allebone, P., St. J. Dixon, Alan, Morley, Jack S., Illidge, T. M., Kirkham, S. R., Short, David

المصدر: BMJ: British Medical Journal, 1992 Nov . 305(6863), 1224-1225.

URL الوصول: https://www.jstor.org/stable/29717650

المؤلفون: Randall, Tony, Muir, John, Mant, David, St. J. Dixon, Allan

المصدر: BMJ: British Medical Journal, 1992 Aug . 305(6851), 473-474.

URL الوصول: https://www.jstor.org/stable/29716721

المؤلفون: St. J. Dixon, Allan

المصدر: BMJ: British Medical Journal, 1988 Jul 01. 297(6641), 137-137.

URL الوصول: https://www.jstor.org/stable/29700153

المؤلفون: St. J. Dixon, Allan, Scott, J. T., Harvey-Smith, E. A.

المصدر: The British Medical Journal, 1960 May 01. 1(5183), 1425-1426.

URL الوصول: https://www.jstor.org/stable/25391274

المؤلفون: St. J. Dixon, A., Treadwell, B. L. J.

المصدر: The British Medical Journal, 1960 Jul . 2(5193), 232-232.

URL الوصول: https://www.jstor.org/stable/25392202

المؤلفون: St. J. Dixon, A., Lindsay, D. J., Collins, E. M.

المصدر: The British Medical Journal, 1971 Feb . 1(5746), 460-460.

URL الوصول: https://www.jstor.org/stable/25413499

المؤلفون: Scott, J. T., St. J. Dixon, A., Bywaters, E. G. L.

المصدر: The British Medical Journal, 1964 Apr . 1(5390), 1070-1073.

URL الوصول: https://www.jstor.org/stable/25398376

المؤلفون: Stuart Friedman, St. J. Dixon-Warren, Oskar Amster, Benedict Drevniok, Yongliang Yang

المصدر: International Symposium for Testing and Failure Analysis.

مصطلحات موضوعية: Scanning probe microscopy, Materials science, Scanning voltage microscopy, business.industry, Microscopy, Scanning confocal electron microscopy, Scanning ion-conductance microscopy, Analytical chemistry, Optoelectronics, Scanning gate microscopy, Scanning capacitance microscopy, business, Vibrational analysis with scanning probe microscopy

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::339d879fbfa2a8841da9ea91de9c1353
https://doi.org/10.31399/asm.cp.istfa2015p0082

المؤلفون: S.B. Kuntze, St. J. Dixon-Warren, J.K. White, Karin Hinzer, Dayan Ban, Edward H. Sargent

المصدر: Critical Reviews in Solid State and Materials Sciences. 30:71-124

مصطلحات موضوعية: Materials science, business.industry, Quantum heterostructure, General Chemical Engineering, Transistor, Scanning capacitance microscopy, Condensed Matter Physics, Capacitance, Electronic, Optical and Magnetic Materials, law.invention, Scanning probe microscopy, Semiconductor, Scanning voltage microscopy, Electrical resistance and conductance, law, Optoelectronics, Electrical and Electronic Engineering, Physical and Theoretical Chemistry, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::02bcd7c76342b3901e3252c24a730fb1
https://doi.org/10.1080/10408430590952523

المؤلفون: S. R. Das, S. Zhang, St. J. Dixon-Warren

المصدر: Journal of Applied Physics. 95:3521-3526

مصطلحات موضوعية: Surface diffusion, Auger electron spectroscopy, Materials science, Analytical chemistry, General Physics and Astronomy, chemistry.chemical_element, Germanium, Metal, Nickel, chemistry.chemical_compound, chemistry, visual_art, Indium phosphide, visual_art.visual_art_medium, Grain boundary diffusion coefficient, Diffusion (business)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b653ce56e82084391f90e33d6bce04c9
https://doi.org/10.1063/1.1682695

المؤلفون: T. Bryskiewicz, R. P. Lu, D. Macquistan, B. Bryskiewicz, St. J. Dixon-Warren, S. Ingrey, G. Smith

المصدر: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 19:1752-1757

مصطلحات موضوعية: Materials science, Dopant, Spreading resistance profiling, business.industry, Nanotechnology, Surfaces and Interfaces, Condensed Matter Physics, Surfaces, Coatings and Films, Secondary ion mass spectrometry, Barrier layer, Semiconductor, Microscopy, Calibration, Optoelectronics, business, Quantum well

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f6a9f5e8cf1f4c1d2bc904a74f65a655
https://doi.org/10.1116/1.1366704

المؤلفون: V. Bondzie, St. J. Dixon-Warren, Y. Yu

المصدر: The Journal of Chemical Physics. 111:10670-10680

مصطلحات موضوعية: Langmuir, Auger electron spectroscopy, Low-energy electron diffraction, Auger effect, Thermal desorption spectroscopy, Chemistry, Analytical chemistry, General Physics and Astronomy, symbols.namesake, Adsorption, Desorption, Electron beam processing, symbols, Physical and Theoretical Chemistry

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::dfe27c504f6555a70fac47a5caf8ae5c
https://doi.org/10.1063/1.480421

المؤلفون: V. Bondzie, L. Zhang, St. J. Dixon-Warren, L. Lucchesi, N. Burson, Y. Yu

المصدر: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 17:2982-2986

مصطلحات موضوعية: Auger electron spectroscopy, Thermal desorption spectroscopy, Polyatomic ion, Analytical chemistry, Surfaces and Interfaces, Condensed Matter Physics, Surfaces, Coatings and Films, chemistry.chemical_compound, Adsorption, chemistry, Desorption, Monolayer, Sticking probability, Butanethiol

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::58a6f6740ce9de1adaa828d567c4d86d
https://doi.org/10.1116/1.581970

المؤلفون: St. J. Dixon-Warren, Qingfeng Ge, D.A. King, A. T. Pasteur

المصدر: Scopus-Elsevier

مصطلحات موضوعية: Hydrogen, General Physics and Astronomy, chemistry.chemical_element, Dissociation (chemistry), Metal, chemistry, Deuterium, visual_art, Thermal, visual_art.visual_art_medium, Physical and Theoretical Chemistry, Impact parameter, Sticking probability, Atomic physics, Molecular beam

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2fc7f290e045458e9db5aa70c83729fb
https://doi.org/10.1063/1.473953

المؤلفون: N. Al-Sarraf, D.A. King, J. T. Stuckless, M. Kovar, St. J. Dixon-Warren, C.E. Wartnaby

المصدر: The Journal of Chemical Physics. 106:2012-2030

مصطلحات موضوعية: Chemistry, Oxide, General Physics and Astronomy, chemistry.chemical_element, Thermodynamics, Calorimetry, Nickel, chemistry.chemical_compound, Adsorption, Chemisorption, Monolayer, Physical chemistry, Physical and Theoretical Chemistry, Sticking probability, Thermal analysis

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::238178be7623c34e046f7ce4f67df000
https://doi.org/10.1063/1.473308

المؤلفون: W. C. Lineberger, Robert F. Gunion, St. J. Dixon-Warren

المصدر: The Journal of Chemical Physics. 104:4902-4910

مصطلحات موضوعية: X-ray photoelectron spectroscopy, Chemistry, Photoemission spectroscopy, Molecular vibration, Excited state, General Physics and Astronomy, Molecular orbital, Electron configuration, Electronic structure, Physical and Theoretical Chemistry, Atomic physics, Ground state

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c72c0e6d6448d2a8a650aa84a86ab33a
https://doi.org/10.1063/1.471123