المؤلفون: Sivadasan, Ajith, Mhira, S., Notin, Armelle, Benhassain, A., Huard, V., Maurin, Etienne, Cacho, F., Anghel, Lorena, Bravaix, A.

المساهمون: Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes 2016-2019 (UGA 2016-2019 ), STMicroelectronics Crolles (ST-CROLLES), Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS)

المصدر: IEEE International Reliability for Physics of Semiconductors (IRPS 2017) ; https://hal.science/hal-01664216 ; IEEE International Reliability for Physics of Semiconductors (IRPS 2017), Apr 2017, Monterey, United States. ⟨10.1109/IRPS.2017.7936357⟩

مصطلحات موضوعية: PACS 85.42, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

جغرافية الموضوع: Monterey, United States

الاتاحة: https://hal.science/hal-01664216
https://doi.org/10.1109/IRPS.2017.7936357

المؤلفون: Cacho, F., Benhassain, A., Shah, R., Huard, V., Anghel, Lorena

المساهمون: STMicroelectronics Crolles (ST-CROLLES), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes 2016-2019 (UGA 2016-2019 )

المصدر: 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS 2017)
https://hal.science/hal-01730857
23rd International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), Jul 2017, Thessaloniki, Greece. pp.247-252

مصطلحات موضوعية: PACS 85.42, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

جغرافية الموضوع: Thessaloniki, Greece

الاتاحة: https://hal.science/hal-01730857

المؤلفون: Anghel, Lorena, Benhassain, A., Sivadasan, A.

المساهمون: Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes 2016-2019 (UGA 2016-2019 ), STMicroelectronics Crolles (ST-CROLLES)

المصدر: IEEE 34th VLSI Test Symposium (VTS'16) ; https://hal.science/hal-01357213 ; IEEE 34th VLSI Test Symposium (VTS'16), Apr 2016, Las Vegas, NE, United States

مصطلحات موضوعية: PACS 8542, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

جغرافية الموضوع: Las Vegas, NE, United States

الاتاحة: https://hal.science/hal-01357213

المؤلفون: Benhassain, A., Cacho, F., Huard, V., Mhira, S., Anghel, Lorena, Parthasarathy, C., Jain, A., Sivadasan, A.

المساهمون: STMicroelectronics Crolles (ST-CROLLES), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes 2016-2019 (UGA 2016-2019 )

المصدر: IEEE International Reliability Physics Semiconductor (IRPS'16) ; https://hal.science/hal-01474794 ; IEEE International Reliability Physics Semiconductor (IRPS'16), Apr 2016, Passadena, United States

مصطلحات موضوعية: PACS 8542, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

جغرافية الموضوع: United States

Time: Passadena, United States

الاتاحة: https://hal.science/hal-01474794

المؤلفون: Benhassain, A., Cacho, F., Huard, V., Anghel, Lorena

المساهمون: STMicroelectronics Crolles (ST-CROLLES), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes 2016-2019 (UGA 2016-2019 )

المصدر: Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems ; https://hal.science/hal-01474797 ; Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems, Mar 2016, Dresden, Germany

مصطلحات موضوعية: PACS 8542, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

جغرافية الموضوع: Dresden, Germany

الاتاحة: https://hal.science/hal-01474797

المؤلفون: Sivadasan, A., Cacho, F., Benhassain, A., Huard, V., Anghel, Lorena

المساهمون: STMicroelectronics Crolles (ST-CROLLES), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes 2016-2019 (UGA 2016-2019 )

المصدر: Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems ; https://hal.science/hal-01474799 ; Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems, Mar 2016, Dresden, Germany

مصطلحات موضوعية: PACS 8542, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

جغرافية الموضوع: Dresden, Germany

الاتاحة: https://hal.science/hal-01474799

المؤلفون: Sivadasan, A., Cacho, F., Benhassain, A., Huard, V., Anghel, Lorena

المساهمون: STMicroelectronics Crolles (ST-CROLLES), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes 2016-2019 (UGA 2016-2019 )

المصدر: Design Automation and Test in Europe (DATE'16) ; https://hal.science/hal-01474800 ; Design Automation and Test in Europe (DATE'16), Mar 2016, Dresden, Germany

مصطلحات موضوعية: PACS 8542, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

جغرافية الموضوع: Dresden, Germany

Relation: hal-01474800; https://hal.science/hal-01474800

الاتاحة: https://hal.science/hal-01474800

المؤلفون: Benhassain, A., Mhira, S., Cacho, F., Huard, V., Anghel, Lorena

المساهمون: STMicroelectronics Crolles (ST-CROLLES), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes 2016-2019 (UGA 2016-2019 )

المصدر: International Verification and Security Workshop ; https://hal.archives-ouvertes.fr/hal-01474807 ; International Verification and Security Workshop, Jul 2016, Sant Feliu de Guixols, Spain

مصطلحات موضوعية: PACS 8542, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

جغرافية الموضوع: Sant Feliu de Guixols, Spain

Relation: hal-01474807; https://hal.archives-ouvertes.fr/hal-01474807

الاتاحة: https://hal.archives-ouvertes.fr/hal-01474807

المؤلفون: Saliva, M., Cacho, F., Huard, V., Federspiel, X., Angot, D., Benhassain, A., Bravaix, A., Anghel, Lorena

المساهمون: STMicroelectronics Crolles (ST-CROLLES), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)

المصدر: Design, Automation & Test in Europe Conference & Exhibition (DATE'15) ; https://hal.science/hal-01400582 ; Design, Automation & Test in Europe Conference & Exhibition (DATE'15), Mar 2015, Grenoble, France. pp.441-446

مصطلحات موضوعية: PACS 8542, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

جغرافية الموضوع: Grenoble, France

الاتاحة: https://hal.science/hal-01400582

المؤلفون: Benhassain, A., Cacho, F., Huard, V., Saliva, M., Anghel, Lorena, Parthasarathy, C., Jain, A., Giner, F.

المساهمون: STMicroelectronics Crolles (ST-CROLLES), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)

المصدر: IEEE Custom Integrated Circuits Conference (ICICC'16) ; https://hal.science/hal-01474805 ; IEEE Custom Integrated Circuits Conference (ICICC'16), Sep 2015, San Jose, CA, United States

مصطلحات موضوعية: PACS 8542, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

جغرافية الموضوع: San Jose, CA, United States

الاتاحة: https://hal.science/hal-01474805

المؤلفون: Mhira, S., Huard, V., Benhassain, A., Cacho, F., Meyer, D., Naudet, S., Jain, A., Parthasarathy, C., Bravaix, A.

المصدر: 2017 IEEE International Test Conference (ITC) ; volume 3a 5, page 1-7

الاتاحة: http://dx.doi.org/10.1109/test.2017.8242042
http://xplorestaging.ieee.org/ielx7/8227522/8242015/08242042.pdf?arnumber=8242042

المؤلفون: Mhira, S., Huard, V., Benhassain, A., Cacho, F., Naudet, S., Jain, A., Parthasarathy, C., Bravaix, A.

المساهمون: Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS)

المصدر: 2017 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS)
https://hal.science/hal-01694458
2017 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2017, Unknown, Unknown Region

مصطلحات موضوعية: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics

جغرافية الموضوع: Unknown, Unknown Region

Relation: hal-01694458; https://hal.science/hal-01694458

الاتاحة: https://hal.science/hal-01694458

المؤلفون: Huard, V., Cacho, F., Benhassain, A., Parthasarathy, C.

المصدر: 2016 IEEE International Reliability Physics Symposium (IRPS) ; page 7C-2-1-7C-2-7

الاتاحة: http://dx.doi.org/10.1109/irps.2016.7574582
http://xplorestaging.ieee.org/ielx7/7565237/7574493/07574582.pdf?arnumber=7574582

المؤلفون: Chittoor Parthasarathy, S. Naudet, Alain Bravaix, Abhishek Jain, Florian Cacho, Vincent Huard, S. Mhira, A. Benhassain

المساهمون: Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), STMicroelectronics [Crolles] (ST-CROLLES), Yncréa Méditerrané

المصدر: Psicologia: Teoria e Pesquisa
Psicologia: Teoria e Pesquisa, 2017, IEEE International Symposium on
Testing and Robust System Design (IOLTS), ⟨10.1109/IOLTS.2017.8046204⟩
IOLTS

مصطلحات موضوعية: Digital electronics, Engineering, business.industry, Control (management), Automotive industry, Control engineering, Reliability engineering, Compensation (engineering), [SPI]Engineering Sciences [physics], Margin (machine learning), Control system, Process control, MESH: NBTI, timing degradation, in-situ monitors, adaptive voltage scaling, control loop, DTMC, energy efficiency, business, Computer-aided software engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1b21e6f242882112236f5658ad0cb898
https://hal.science/hal-03654374

المؤلفون: Sivadasan, A., Benhassain, A., Huard, V., Cacho, F., Anghel, L.

المساهمون: Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA), STMicroelectronics [Crolles] (ST-CROLLES)

المصدر: IEEE International Reliability for Physics of Semiconductors (IRPS 2017)
IEEE International Reliability for Physics of Semiconductors (IRPS 2017), Apr 2017, Monterey, United States

مصطلحات موضوعية: PACS 85.42, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, ComputingMilieux_MISCELLANEOUS

URL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::45eb52cc3436e5aaf55385754586d5bd
https://hal.archives-ouvertes.fr/hal-01664216

المؤلفون: Alain Bravaix, Etienne Maurin, Armelle Notin, Florian Cacho, S. Mhira, A. Benhassain, Vincent Huard, Ajith Sivadasan, Lorena Anghel

المساهمون: Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019]), STMicroelectronics [Crolles] (ST-CROLLES), Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS)-Aix Marseille Université (AMU), Yncréa Méditerrané

المصدر: IEEE International Reliability for Physics of Semiconductors (IRPS 2017)
IEEE International Reliability for Physics of Semiconductors (IRPS 2017), Apr 2017, Monterey, United States. ⟨10.1109/IRPS.2017.7936357⟩
2017 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS)
2017 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2017, Unknown, Unknown Region
2017 IEEE International Reliability Physics Symposium (IRPS)
2017 IEEE International Reliability Physics Symposium (IRPS), Apr 2017, Monterey, France. pp.CR-8.1-CR-8.4, ⟨10.1109/IRPS.2017.7936357⟩

مصطلحات موضوعية: Standard cell, Digital electronics, Aging, Engineering, Negative-bias temperature instability, business.industry, Static timing analysis, Workload, Failure rate, BTI, Reliability, 7. Clean energy, Reliability engineering, [SPI]Engineering Sciences [physics], Logic gate, PACS 85.42, Portfolio, Gate-level, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, business, Simulation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6ab2a853f8ef57b848779c50f09d93e5
https://hal.science/hal-01664216

المؤلفون: Mhira, Souhir, Huard, Vincent, Benhassain, Ahmed, Cacho, Florian, Naudet, Sylvain, Jain, Abhishek, Parthasarathy, Chittoor, Bravaix, Alain

المساهمون: Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), STMicroelectronics Crolles (ST-CROLLES), Yncréa Méditerrané

المصدر: ISSN: 0102-3772 ; EISSN: 1806-3446.

مصطلحات موضوعية: MESH: NBTI, timing degradation, in-situ monitors, adaptive voltage scaling, control loop, DTMC, energy efficiency, [SPI]Engineering Sciences [physics]

Relation: hal-03654374; https://hal.science/hal-03654374

الاتاحة: https://hal.science/hal-03654374
https://doi.org/10.1109/IOLTS.2017.8046204

المؤلفون: Benhassain, Ahmed

المساهمون: STAR, ABES, Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP ), Université Grenoble Alpes (UGA), Université Grenoble Alpes, Lorena Anghel, Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])

المصدر: Micro et nanotechnologies/Microélectronique. Université Grenoble Alpes, 2017. Français. ⟨NNT : 2017GREAT126⟩

مصطلحات موضوعية: Moniteur in-Situ, Téchnologie CMOS, [SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Monitor, Variabilité, Reliability, Adaptive voltage scaling, CMOS technology, BTI.HCI. capteur de vieillissement, Aging sensor . BTI. HCI, Fiabilité, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Variability, Régulation de la tension d'alimentation

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::49e8f2d3a8453d42a52a2fd41e9b8686
https://theses.hal.science/tel-03367612

المؤلفون: Chittoor Parthasarathy, Abhishek Jain, S. Mhira, A. Benhassain, Vincent Huard, S. Naudet, Alain Bravaix, Florian Cacho

المساهمون: Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS)-Aix Marseille Université (AMU), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), STMicroelectronics [Crolles] (ST-CROLLES), ST Microelectronics Greater Noida, Yncréa Méditerrané, Bibliométrie, IM2NP

المصدر: 2017 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS)
2017 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2017, Unknown, Unknown Region
2017 IEEE International Reliability Physics Symposium (IRPS)
2017 IEEE International Reliability Physics Symposium (IRPS), Apr 2017, Monterey, France. pp.3A-4.1-3A-4.7, ⟨10.1109/IRPS.2017.7936279⟩

مصطلحات موضوعية: Engineering, NBTI, [SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Voltage control, Automotive industry, control loop, 02 engineering and technology, 01 natural sciences, [SPI]Engineering Sciences [physics], Robustness (computer science), 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, timing degradation, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, DTMC, Computer Science::Operating Systems, energy efficiency, Electronic circuit, 010302 applied physics, Markov chain, business.industry, in-situ monitors, 020202 computer hardware & architecture, Microcontroller, Adaptive voltage scaling, Control system, business, adaptive voltage scaling

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b0473b6bc0c0d11c3dbc4fcd9af71def
https://hal.archives-ouvertes.fr/hal-01694458

المؤلفون: S. Mhira, Vincent Huard, Florian Cacho, Lorena Anghel, A. Benhassain

المساهمون: STMicroelectronics [Crolles] (ST-CROLLES), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019]), Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)

المصدر: International Verification and Security Workshop
International Verification and Security Workshop, Jul 2016, Sant Feliu de Guixols, Spain
HAL
IVSW

مصطلحات موضوعية: Engineering, business.industry, 020208 electrical & electronic engineering, Spice, Real-time computing, Static timing analysis, 02 engineering and technology, Chip, Die (integrated circuit), 020202 computer hardware & architecture, Reliability (semiconductor), PACS 8542, CMOS, 0202 electrical engineering, electronic engineering, information engineering, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, business, Critical path method, ComputingMilieux_MISCELLANEOUS, Block (data storage)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::70071b13896b0e9dc19691765c3792ff
https://hal.archives-ouvertes.fr/hal-01474807