المؤلفون: A. B. M. Klaassen, C. A. M. Van Ginneken, J. F. Rodrigues De Miranda, R. Th. R. Wentges, Y. J. B. Van Megen

المصدر: JIBI INKOKA TEMBO. 1988, 31(Supplement7):1035

المؤلفون: X. Li, W. Wu, G. Gildenblat, G. D. J. Smit, A. J. Scholten, D. B. M. Klaassen, Psp Developers, Geert D. J. Smit, Andries J. Scholten, Dirk B. M. Klaassen, Ronald Van Langevelde, Gennady Gildenblat, Xin Li, Weimin Wu

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.semiconductors.philips.com/acrobat/other/models/psp102p3_summary.pdf.

مصطلحات موضوعية: Subcategory

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.182.7398; http://www.semiconductors.philips.com/acrobat/other/models/psp102p3_summary.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.182.7398
http://www.semiconductors.philips.com/acrobat/other/models/psp102p3_summary.pdf

المؤلفون: D. B. M. Klaassen, G. Gildenblat, X. Li, H. Wang, W. Wu, R. Van Langevelde Way, A. J. Scholten Way, D. B. M. Klaassen Way

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.extra.research.philips.com/publ/rep/nl-ur/PR-TN2006-00546.pdf.

مصطلحات موضوعية: Abstract

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.160.3864; http://www.extra.research.philips.com/publ/rep/nl-ur/PR-TN2006-00546.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.160.3864
http://www.extra.research.philips.com/publ/rep/nl-ur/PR-TN2006-00546.pdf

المؤلفون: R. van Langevelde, A.J. Scholten, D. B. M. Klaassen, A. J. Scholten Way, D. B. M. Klaassen Way

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.extra.research.philips.com/publ/rep/nl-ur/ur2002-802.pdf.

مصطلحات موضوعية: MOS Model 11, compact modelling, MOSFET, CMOS, circuit simulation

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.2.8885; http://www.extra.research.philips.com/publ/rep/nl-ur/ur2002-802.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.2.8885
http://www.extra.research.philips.com/publ/rep/nl-ur/ur2002-802.pdf

المؤلفون: A.J. Scholten, D. B. M. Klaassen Wag, Author(s) A. J. Scholten, D. B. M. Klaassen

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.extra.research.philips.com/publ/rep/nl-ur/ur816-98.pdf.

مصطلحات موضوعية: Mos Model 9, 1/f noise, parameter extraction, level 903 Abstract, The 1=f noise model in MOS Model 9, level 902, fails to

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.3.1754; http://www.extra.research.philips.com/publ/rep/nl-ur/ur816-98.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.3.1754
http://www.extra.research.philips.com/publ/rep/nl-ur/ur816-98.pdf

المؤلفون: W. Wu A, X. Li A, G. Gildenblat A, G. O. Workman B, S. Veeraraghavan B, C. C. Mcandrew C, R. Van Langevelde D, G. D. J. Smit E, A. J. Scholten E, D. B. M. Klaassen E, J. Watts F, Prof S. Cristoloveanu, Surface Potential, Tunneling Current

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://pspmodel.asu.edu/downloads/Wu_2009 SSE_PSPSOI.pdf.

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.527.5570; http://pspmodel.asu.edu/downloads/Wu_2009 SSE_PSPSOI.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.527.5570
http://pspmodel.asu.edu/downloads/Wu_2009 SSE_PSPSOI.pdf

المؤلفون: Gert-jan Smit, Andries Scholten, D. B. M. Klaassen, Nxp Semiconductors, Gennady Gildenblat, Weimin Wu, Xin Li, Amit Jha, Hailing Wang, Semiconductorsfounded Philips, Non-quasi Static Effects, Summary References

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.mos-ak.org/montreux/papers/03_Smit_MOS-AK06.pdf.

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.692.4843; http://www.mos-ak.org/montreux/papers/03_Smit_MOS-AK06.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.692.4843
http://www.mos-ak.org/montreux/papers/03_Smit_MOS-AK06.pdf

المؤلفون: R. Van Langevelde, A. J. Scholten, G. D. J. Smit, D. B. M. Klaassen, G. Gildenblat, X. Li, H. Wang, W. Wu, A. J. Scholten Way

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.extra.research.philips.com/publ/rep/nl-ur/PR-TN2005-00303.pdf.

مصطلحات موضوعية: PSP Model, compact modelling, MOSFET, CMOS, circuit simulation, integrated

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.73.6759; http://www.extra.research.philips.com/publ/rep/nl-ur/PR-TN2005-00303.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.73.6759
http://www.extra.research.philips.com/publ/rep/nl-ur/PR-TN2005-00303.pdf

المؤلفون: A. J. Scholten, L. F. Tiemeijer, R. Van Langevelde, R. J. Havens, V. C. Venezia, A. T. A. Zegers-van Duijnhoven, B. Neinhüs, C. Jungemann, D. B. M. Klaassen

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.nxp.com/acrobat_download/other/models/sch2002_iedm.pdf.

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.129.8523; http://www.nxp.com/acrobat_download/other/models/sch2002_iedm.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.129.8523
http://www.nxp.com/acrobat_download/other/models/sch2002_iedm.pdf

المؤلفون: D. B. M. Klaassen

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.esscirc.org/papers-96/203.pdf.

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.32.2631; http://www.esscirc.org/papers-96/203.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.32.2631
http://www.esscirc.org/papers-96/203.pdf

المؤلفون: K.G. McCarthy, Mos Model, Author(s K. G. Mccarthy, R. D. M. A. Velghe, D. B. M. Klaassen

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.extra.research.philips.com/publ/rep/nl-ur/ur027-95.pdf.

مصطلحات موضوعية: BSIM3, BSIM3v2, compact models, mos model 9 1 K.G. McCarthy is with the

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.5.6666; http://www.extra.research.philips.com/publ/rep/nl-ur/ur027-95.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.5.6666
http://www.extra.research.philips.com/publ/rep/nl-ur/ur027-95.pdf

المؤلفون: D. B. M. Klaassen, Ramses van der Toorn, Ralf Pijper, G.D.J. Smit, Andries J. Scholten, L. F. Tiemeijer

المصدر: IEEE Transactions on Electron Devices. 61:245-254

مصطلحات موضوعية: Engineering, business.industry, Emphasis (telecommunications), Electrical engineering, Y-factor, Noise figure, Low-noise amplifier, Noise (electronics), Electronic, Optical and Magnetic Materials, CMOS, MOSFET, Electronic engineering, Flicker noise, Electrical and Electronic Engineering, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::35974c1e544ab6956990804980296424
https://doi.org/10.1109/ted.2013.2282960

المؤلفون: G. D. J. Smit, A. J. Scholten, R. M. T. Pijper, R. van Langevelde, A. Mercha, G. Gildenblat, D. B. M. Klaassen, SERRA, Nicola

المساهمون: G. D. J., Smit, A. J., Scholten, Serra, Nicola, R. M. T., Pijper, R., van Langevelde, A., Mercha, G., Gildenblat, D. B. M., Klaassen

Relation: info:eu-repo/semantics/altIdentifier/isbn/142440438X; info:eu-repo/semantics/altIdentifier/isbn/1424404398; info:eu-repo/semantics/altIdentifier/wos/WOS:000247357700215; ispartofbook:Proceedings International Electron Devices Meeting (IEDM) Tech. Digest; 2006 Electron Devices Meeting; firstpage:175; lastpage:178; numberofpages:4; http://hdl.handle.net/11390/1009146; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-46049118238

الاتاحة: http://hdl.handle.net/11390/1009146
https://doi.org/10.1109/IEDM.2006.346990

المؤلفون: Colin C. McAndrew, G.O. Workman, R. van Langevelde, Xin Li, S. Veeraraghavan, Gennady Gildenblat, G.D.J. Smit, D. B. M. Klaassen, Andries J. Scholten, W. Wu

المصدر: IEEE Transactions on Electron Devices. 54:316-322

مصطلحات موضوعية: Engineering, business.industry, Electrical engineering, Silicon on insulator, Hardware_PERFORMANCEANDRELIABILITY, Electronic, Optical and Magnetic Materials, Tunnel effect, Depletion region, Gate oxide, Logic gate, MOSFET, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, Electrical and Electronic Engineering, business, Quantum tunnelling, Hardware_LOGICDESIGN, Electronic circuit

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f3196accae0bcd917e1ae70dc3a554c4
https://doi.org/10.1109/ted.2006.888750

المؤلفون: Tony Vanhoucke, J. Melai, P.H.C. Magnee, Anurag Vohra, T. V. Dinh, D. B. M. Klaassen

المصدر: 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).

مصطلحات موضوعية: Harmonic analysis, Reduction (complexity), Engineering, Harmonic balance, business.industry, Electronic engineering, Process (computing), Linearity, Radio frequency, Transient (oscillation), business, Signal

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1f62f142ee0eff7da0f780adcc50d1d4
https://doi.org/10.1109/sispad.2015.7292289

المؤلفون: P. Ivo, P.H.C. Magnee, Tony Vanhoucke, Anco Heringa, Mahmoud Al-Sa'di, T. V. Dinh, D. B. M. Klaassen

المصدر: 2014 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM).

مصطلحات موضوعية: Materials science, business.industry, Heterojunction bipolar transistor, Amplifier, RF power amplifier, Electrical engineering, Hardware_PERFORMANCEANDRELIABILITY, Silicon-germanium, chemistry.chemical_compound, Impact ionization, Reliability (semiconductor), chemistry, Hardware_GENERAL, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, Breakdown voltage, business, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4f4ecc9089717fad234ee423b9fef89e
https://doi.org/10.1109/bctm.2014.6981280

المؤلفون: Andries J. Scholten, D. B. M. Klaassen, Ralf Pijper, L. F. Tiemeijer, G.D.J. Smit, Ronald van Langevelde

المصدر: IEEE Electron Device Letters. 31:884-886

مصطلحات موضوعية: Engineering, Noise measurement, business.industry, Semiconductor device modeling, Noise (electronics), Electronic, Optical and Magnetic Materials, CMOS, MOSFET, Electronic engineering, Node (circuits), Radio frequency, Electrical and Electronic Engineering, business, Scaling

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a17bd1f633364dafc54aef671ed4639e
https://doi.org/10.1109/led.2010.2051132

المؤلفون: A. C. T. Aarts, Andries J. Scholten, D. B. M. Klaassen, S. J. Sque

المصدر: 2013 IEEE International Electron Devices Meeting.

مصطلحات موضوعية: LDMOS, Engineering, business.industry, MOSFET, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Hardware_PERFORMANCEANDRELIABILITY, business, Capacitance, Network analysis, Communication channel

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::04c03467a8731b3268589445a2079950
https://doi.org/10.1109/iedm.2013.6724619

المؤلفون: Tony Vanhoucke, E. Gridelet, T. V. Dinh, Ralf Pijper, D. B. M. Klaassen

المصدر: 2013 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM).

مصطلحات موضوعية: Materials science, Avalanche diode, Kirk effect, Physics::Instrumentation and Detectors, business.industry, RF power amplifier, Electrical engineering, Linearity, Power performance, High voltage, Avalanche breakdown, Power (physics), Hardware_INTEGRATEDCIRCUITS, Optoelectronics, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::590d6530d5b088aaf8f59ffea27cdad7
https://doi.org/10.1109/bctm.2013.6798132

المؤلفون: S. K. Jones, D. B. M. Klaassen, M. C. Vecchi, Wim Schoenmaker, J. G. Metcalfe, Kevin G. McCarthy, Alan Mathewson, A. De Keersgieter, J.A.M. Otten, A. v. Schwerin, M. Rudan

المصدر: Microelectronic Engineering. 34:67-84

مصطلحات موضوعية: Engineering drawing, Computer science, Frame (networking), Integrated circuit, Condensed Matter Physics, computer.software_genre, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Work (electrical), law, Computer Aided Design, Electrical and Electronic Engineering, computer, Theme (computing)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b02fa335123a76ab33f00fa9be766b1d
https://doi.org/10.1016/s0167-9317(96)00017-2