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1Dissertation/ Thesis
المؤلفون: Pohlmann, Tobias
Thesis Advisors: Prof. Dr. Joachim Wollschläger, Dr. Florian Bertram
مصطلحات موضوعية: magnetic thin films, magnetite, Fe3O4, synchrotron radiation, XRD, XAS, XMCD, XRMR, XRR, 33.68 - Oberflächen, Dünne Schichten, Grenzflächen, 33.75 - Magnetische Materialien, 68.35.Ct - Interface structure and roughness, 68.55.Ac - Nucleation and growth: microscopic aspects, 68.35.Bs - Structure of clean surfaces (reconstruction), 68.47.Gh - Oxide surfaces, 68.55.Jk - Structure and morphology, thickness, crystalline orientation and texture, 68.55.Nq - Composition and phase identification, 75.70.Ak - Magnetic properties of monolayers and thin films, 75.70.Cn - Magnetic properties of interfaces, 75.70.Rf - Surface magnetism, ddc:530
وصف الملف: application/pdf; application/zip
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2
المؤلفون: Teresa Ben, D.F. Reyes, V. Braza, JM José Maria Ulloa, A. Gonzalo, David González, A. D. Utrilla
المصدر: Nanoscale Research Letters
Nanoscale Research Letters, Vol 12, Iss 1, Pp 1-10 (2017)مصطلحات موضوعية: Diffraction, Materials science, Photoluminescence, Nanotechnology, 81.05.Ea (III-V semiconductors), 02 engineering and technology, Photodetection, Nitride, 7. Clean energy, 01 natural sciences, Molecular physics, law.invention, Structural and optical characterization, law, Dilute nitride semiconductor, 0103 physical sciences, Solar cell, lcsh:TA401-492, General Materials Science, Wafer, 68.55.Nq composition and phase identification, 010302 applied physics, Nano Express, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 81.15.Hi (molecular beam epitaxy), Temperature gradient, GaAsSbN, lcsh:Materials of engineering and construction. Mechanics of materials, 0210 nano-technology, 71.20.Nr Semiconductor compounds, Molecular beam epitaxy
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3Dissertation/ Thesis
المؤلفون: Suendorf, Martin
Thesis Advisors: Prof. Dr. Joachim Wollschläger, Prof. Dr. Michael Reichling
مصطلحات موضوعية: thin films, molecular beam epitaxy, x-ray reflectometry, x-ray diffraction, low energy electron diffraction, x-ray photoemission spectroscopy, charge transfer multiplet, 33.05 - Experimentalphysik, 33.07 - Spektroskopie, 33.68 - Oberflächen, Dünne Schichten, Grenzflächen, 61.10.Kw - X-ray reflectometry, 61.10.Nz - X-ray diffraction, 61.14.Hg - Low-energy electron diffraction (LEED) and reflection high-energy electron diffraction (RHEED), 68.55.Nq - Composition and phase identification, 79.60.Dp - Adsorbed layers and thin films, ddc:530
وصف الملف: application/pdf; application/zip
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4
المؤلفون: JM José Maria Ulloa, Lara Dominguez, D.F. Reyes, David González, David L. Sales, Adrian Hierro, Alvaro Mayoral
المصدر: Nanoscale Research Letters
Nanoscale Research Letters, ISSN 1931-7573, 2012-11-27, Vol. 2012, No. 7
Archivo Digital UPM
instnameمصطلحات موضوعية: 68.55.Ln defects and impurities: doping, implantation, distribution, concentration, etc, Photoluminescence, Materials science, Nanochemistry, Nanotechnology, 02 engineering and technology, Electron, 01 natural sciences, Atomic units, N incorporation, Materials Science(all), 78.55.Cr III-V semiconductors, 73.21.La quantum dots, 0103 physical sciences, General Materials Science, 68.55.Nq composition and phase identification, Electronic band structure, Deposition (law), 010302 applied physics, Telecomunicaciones, Sb distribution, Strain state, Nano Express, business.industry, 021001 nanoscience & nanotechnology, Condensed Matter Physics, III-V quantum dots, GaAsSb, Quantum dot, Transmission electron microscopy, Optoelectronics, Electrónica, 0210 nano-technology, business
وصف الملف: application/pdf