المؤلفون: Silvonen K, Zhu NH, Liu Y, Silvonen, K, Helsinki Univ Technol, Circuit Theory Lab, FIN-02015 Helsinki, Finland. E-mail: kimmo.silvonen@tkk.fi, nhzhu@red.semi.ac.cn, yliusemi@hotmail.com

مصطلحات موضوعية: Calibration, Deembedding, Error Model, 15 Term, Four-port, Network Analyzer, Parasitic, Scattering Parameter, 16 Term, Network-analyzer Calibration, Scattering-parameter, Load Impedances, Leakage Errors, Complex Source, T-parameters, S-parameters, Conversions, Devices, Abcd, 光电子学, system analysis, heraldry, 校准, calibrage, etalonnage, kalibrierung, 定标, 网络理论, network theory, systems analysis

Relation: IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES; Silvonen K; Zhu NH; Liu Y .A 16-term error model based on linear equations of voltage and current variables ,IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES,2006,54(4):1464-1469; http://ir.semi.ac.cn/handle/172111/10704

الاتاحة: http://ir.semi.ac.cn/handle/172111/10704