المؤلفون: F. Chinni, F. Spizzo, F. Montoncello, V. Mattarello, C. Maurizio, G. Mattei, L. Del Bianco

المساهمون: Chinni, F., Spizzo, F., Montoncello, F., Mattarello, V., Maurizio, C., Mattei, G., Del Bianco, L.

مصطلحات موضوعية: magnetic hysteresi, magnetic anisotropy, exchange interaction, nanocomposite material, SQUID magnetization measurement, micromagnetic modeling

وصف الملف: ELETTRONICO

Relation: ispartofbook:Book of Abstracts - Magnet 2017; Magnet 2017; firstpage:B1-2; lastpage:B1-2; numberofpages:1; http://hdl.handle.net/11392/2404222

الاتاحة: http://hdl.handle.net/11392/2404222

المؤلفون: G. Monaco, D. Garoli, R. Frison, V. Mattarello, P. Nicolosi, M. G. Pelizzo, V. Rigato, L. Armelao, A. Giglia, NANNARONE, Stefano

المساهمون: G., Monaco, D., Garoli, R., Frison, V., Mattarello, P., Nicolosi, M. G., Pelizzo, V., Rigato, L., Armelao, A., Giglia, Nannarone, Stefano

مصطلحات موضوعية: optical constants

وصف الملف: STAMPA

Relation: info:eu-repo/semantics/altIdentifier/isbn/9780819463968; info:eu-repo/semantics/altIdentifier/wos/WOS:000241972700031; ispartofbook:ADVANCES IN X-RAY/EUV OPTICS, COMPONENTS, AND APPLICATIONS; Conference on Advances in X-Ray/EUV Optics, Components and Applications; volume:6317; firstpage:631712; lastpage:631712-12; serie:PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING; http://hdl.handle.net/11380/743065; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-33750578599

الاتاحة: http://hdl.handle.net/11380/743065
https://doi.org/10.1117/12.684088

المؤلفون: PASQUALI, Luca, MONTECCHI, Monica, NANNARONE, Stefano, N. Mahne, V. Mattarello

المساهمون: Pasquali, Luca, N., Mahne, Montecchi, Monica, V., Mattarello, Nannarone, Stefano

مصطلحات موضوعية: ruthenium, spectroscopy, thin film, semiconductors

وصف الملف: STAMPA

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000263803300070; volume:105; issue:4; firstpage:044304-1; lastpage:044304-6; journal:JOURNAL OF APPLIED PHYSICS; http://hdl.handle.net/11380/622736; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-61449113009

الاتاحة: http://hdl.handle.net/11380/622736
https://doi.org/10.1063/1.3079507

المؤلفون: Gianluigi Maggioni, V. Mattarello, G. Salmaso, Maria Guglielmina Pelizzo, V. Rigato, Piergiorgio Nicolosi, Alessandro Patelli, Laura E. Depero, Elza Bontempi, Paolo Mazzoldi

المصدر: Surface and Coatings Technology. :40-48

مصطلحات موضوعية: Materials science, Ion beam analysis, Hydrogen, Extreme ultraviolet lithography, Analytical chemistry, chemistry.chemical_element, Noble gas, Surfaces and Interfaces, General Chemistry, Partial pressure, Substrate (electronics), Condensed Matter Physics, Surfaces, Coatings and Films, X-ray reflectivity, chemistry, Sputtering, Materials Chemistry

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0ffa9fa78489bf01236380357e8a6931
https://doi.org/10.1016/s0257-8972(03)00706-0

المؤلفون: S. BOLLANTI, D. AMODIO, A. CONTI, P. DI LAZZARO, F. FLORA, L. MEZI, D. MURRA, A. TORRE, C. E. ZHENG, D. GAROLI, M. G. PELIZZO, NICOLOSI, PIERGIORGIO, V. MATTARELLO, V. RIGATO, A. GERARDINO

المساهمون: Bollanti, S., Amodio, D., Conti, A., DI LAZZARO, P., Flora, F., Mezi, L., Murra, D., Torre, A., Zheng, C. E., Garoli, D., Pelizzo, M. G., Nicolosi, Piergiorgio, Mattarello, V., Rigato, V., Gerardino, A.

Relation: info:eu-repo/semantics/altIdentifier/isbn/9780819468512; info:eu-repo/semantics/altIdentifier/wos/WOS:000252168700004; ispartofbook:Ultrafast X-Ray Sources and Detectors; SPIE - Ultrafast X-Ray Sources and Detectors; volume:6703; numberofpages:12; http://hdl.handle.net/11577/1780399; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-42149094008

الاتاحة: http://hdl.handle.net/11577/1780399
https://doi.org/10.1117/12.751442

المؤلفون: FRASSETTO, FABIO, GAROLI, DENIS, NICOLOSI, PIERGIORGIO, G. MONACO, M. Pascolini, M. G. Pelizzo, V. Mattarello, PATELLI, ALESSANDRO, V. Rigato, A. Giglia, S. Nannarone, E. Antonucci, S. Fineschi, M. Romoli

المساهمون: Frassetto, Fabio, Garoli, Deni, Monaco, G., Nicolosi, Piergiorgio, Pascolini, M., Pelizzo, M. G., Mattarello, V., Patelli, Alessandro, Rigato, V., Giglia, A., Nannarone, S., Antonucci, E., Fineschi, S., Romoli, M.

Relation: info:eu-repo/semantics/altIdentifier/isbn/9780819459060; ispartofbook:SPIE Conf. Proc. Optics for EUV, X-Ray, and Gamma-Ray Astronomy II; SPIE Optics for EUV, X-Ray, and Gamma-Ray Astronomy II; volume:5901; issue:SPIE conf proceedings; firstpage:161; lastpage:172; numberofpages:12; http://hdl.handle.net/11577/2473088; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-29944439332

الاتاحة: http://hdl.handle.net/11577/2473088

المؤلفون: F. Frassetto, D. Garoli, G. Monaco, P. Nicolosi, M. Pascolini, M. G. Pelizzo, V. Mattarello, A. Patelli, V. Rigato, A. Giglia, S. Nannarone, E. Antonucci, S. Fineschi, M. Romoli

المساهمون: Frassetto, F., Garoli, D., Monaco, G., Nicolosi, P., Pascolini, M., Pelizzo, M. G., Mattarello, V., Patelli, A., Rigato, V., Giglia, A., Nannarone, S., Antonucci, E., Fineschi, S., Romoli, M.

مصطلحات موضوعية: space instrumentation, multilayers

وصف الملف: STAMPA

Relation: ispartofbook:Proceedings of SPIE - The International Society for Optical Engineering; Solar Physics and Space Weather Instrumentation; volume:5901; firstpage:59010L; lastpage:59010L-12; serie:PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING; http://hdl.handle.net/11380/743077; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-29944439332

الاتاحة: http://hdl.handle.net/11380/743077
https://doi.org/10.1117/12.616848

المؤلفون: Juri Bertoli, V. Mattarello, Daniele Spiga, Enrico Boscolo Marchi, G. Tagliaferri, G. Salmaso, Denis Garoli, Giovanni Pareschi, Jacques Kools

المصدر: SPIE Proceedings.

مصطلحات موضوعية: Materials science, business.industry, X-ray optics, engineering.material, Engineering physics, Metrology, law.invention, Telescope, Optics, Optical coating, Coating, law, Physical vapor deposition, engineering, Process control, business, Advanced process control

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fc8e6360fd0ea46df3a28c9d9f0f2644
https://doi.org/10.1117/12.820428

المؤلفون: G. Tagliaferri, S. Basso, G. Borghi, W. Burkert, O. Citterio, M. Civitani, P. Conconi, V. Cotroneo, M. Freyberg, D. Garoli, P. Gorenstein, G. Hartner, V. Mattarello, A. Orlandi, G. Pareschi, S. Romaine, D. Spiga, G. Valsecchi, D. Vernani, Jéro^me Rodriguez, Phillippe Ferrando

مصطلحات موضوعية: Physics, Fabrication, Image quality, business.industry, Antenna aperture, Phase (waves), FOS: Physical sciences, Quality (physics), Optics, Electroforming, Angular resolution, Sensitivity (control systems), business, Astrophysics - Instrumentation and Methods for Astrophysics, Instrumentation and Methods for Astrophysics (astro-ph.IM)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::60966257a1b11a21d746e30485263df9

المؤلفون: Juri Bertoli, V. Mattarello, Angelo Giglia, Valentino Rigato, Nicola Mahne, S. Nannarone

المصدر: Damage to VUV, EUV, and X-ray Optics, pp. 1–9, Prague, Czech Republic, 18 April 2007
info:cnr-pdr/source/autori:Nicola Mahne(1); Angelo Giglia(1); Stefano Nannarone(1,2); Juri Bertoli(3,4); Valentina Mattarello(3,4); Valentino Rigato(3,4)/congresso_nome:Damage to VUV, EUV, and X-ray Optics/congresso_luogo:Prague, Czech Republic/congresso_data:18 April 2007/anno:2007/pagina_da:1/pagina_a:9/intervallo_pagine:1–9

مصطلحات موضوعية: Photon, Materials science, Silicon, business.industry, Physics::Optics, chemistry.chemical_element, Bragg peak, Condensed Matter::Materials Science, Optics, Quality (physics), chemistry, Excited state, Phenomenological model, Radiation damage, business, Spectroscopy

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fb5fa5862fc0bfc2b8289f553fbc95a5
https://doi.org/10.1117/12.722922

المؤلفون: V. Mattarello, D. Amodio, Luca Mezi, P. Di Lazzaro, Denis Garoli, M. G. Pelizzo, Daniele Murra, Sarah Bollanti, P. Nicolosi, Francesco Flora, Amalia Torre, Valentino Rigato, Cheng En Zheng, Annamaria Gerardino, A. Conti

المصدر: Proc. SPIE 6703, 670308, pp. 670308, 2007
info:cnr-pdr/source/autori:S. Bollanti, D. Amodio, A. Conti, P. Di Lazzaro, F. Flora, L. Mezi, D. Murra, A. Torre, C. E. Zheng, D. Garoli, M. G. Pelizzo, P. Nicolosi, V. Mattarello, V. Rigato, and A. Gerardino/congresso_nome:Proc. SPIE 6703, 670308/congresso_luogo:/congresso_data:2007/anno:2007/pagina_da:670308/pagina_a:/intervallo_pagine:670308

مصطلحات موضوعية: Materials science, Excimer laser, business.industry, medicine.medical_treatment, Extreme ultraviolet lithography, Plasma, Laser, Debris, law.invention, Wavelength, Optics, law, Extreme ultraviolet, medicine, Optoelectronics, business, Lithography

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fe7f35c280f997c0b637e6c25b1faadc
http://hdl.handle.net/11577/1780399

المؤلفون: V. Rigato, G. Monaco, V. Mattarello, Denis Garoli, Fabio Frassetto, Piergiorgio Nicolosi, Maria Guglielmina Pelizzo, L. Armelao

المصدر: Radiation physics and chemistry (1993) 75 (2006): 1966–1971.
info:cnr-pdr/source/autori:Garoli D., Monaco G., Frassetto F., Pelizzo M.G., Nicolosi P., Armelao L., Matterello V., Rigato V./titolo:Thin film and multilayer coating development for the extreme ultraviolet spectral region/doi:/rivista:Radiation physics and chemistry (1993)/anno:2006/pagina_da:1966/pagina_a:1971/intervallo_pagine:1966–1971/volume:75

مصطلحات موضوعية: Radiation, Materials science, business.industry, Extreme ultraviolet lithography, Analytical chemistry, Sputter deposition, engineering.material, Evaporation (deposition), Optical coating, Coating, Sputtering, Extreme ultraviolet, engineering, Optoelectronics, Thin film, OPTICAL-CONSTANTS, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::da6012ff80735d71e37daad970b14bcb
http://hdl.handle.net/11577/1563655

المؤلفون: G. Tagliaferri, S. Basso, G. Borghi, W. Burkert, O. Citterio, P. Conconi, V. Cotroneo, M. Freyberg, D. Garoli, G. Hartner, V. Mattarello, A. Orl, G. Pareschi, D. Spiga, G. Valsecchi, D. Vernani

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://arxiv.org/pdf/0903.2483v1.pdf.

مصطلحات موضوعية: X-ray, Instrumentation

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.244.6816; http://arxiv.org/pdf/0903.2483v1.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.244.6816
http://arxiv.org/pdf/0903.2483v1.pdf