المؤلفون: V. P. Krylov, A. M. Bogachev, T. Yu. Pronin

المصدر: Радиопромышленность, Vol 29, Iss 2, Pp 35-44 (2019)

مصطلحات موضوعية: semiconductor components, potential defect, deep level transient spectroscopy, frequency scanning, Electronics, TK7800-8360

Relation: https://www.radioprom.org/jour/article/view/486; https://doaj.org/toc/2413-9599; https://doaj.org/toc/2541-870X; https://doaj.org/article/e758ba0d199445399cb85a03e0f2c9a7

الاتاحة: https://doi.org/10.21778/2413-9599-2019-29-2-35-44
https://doaj.org/article/e758ba0d199445399cb85a03e0f2c9a7

المؤلفون: АЛИМОВА Э.К., НИКОЛАЕВА Н.Г.

مصطلحات موضوعية: КАЧЕСТВО,АНАЛИЗ ВИДОВ,ПОСЛЕДСТВИЯ ОТКАЗОВ,ПОТЕНЦИАЛЬНЫЙ ДЕФЕКТ,ПРИОРИТЕТНОЕ ЧИСЛО РИСКА,QUALITY OF ANALYSIS TYPES,THE CONSEQUENCES OF FAILURE,A POTENTIAL DEFECT BY PRIORITY RISK

وصف الملف: text/html

الاتاحة: http://cyberleninka.ru/article/n/metod-fmea-kak-put-povysheniya-kachestva-produktsii
http://cyberleninka.ru/article_covers/16133293.png

المؤلفون: Mukherjee, S., Udpa, L., Udpa, S., Tamburrino, A.

المساهمون: Vari, Mukherjee, S., Udpa, L., Udpa, S., Tamburrino, A.

مصطلحات موضوعية: Corrosion resistance, Electromagnetic wave, Terahertz wave, Time domain analysis, Adhesively bonded structure, Far field measurement, Non-destructive evaluation technique, Parametric -analysi, Potential defect, Simulation studie, Time reversal imaging, Time-reversal methods, Nondestructive examination

وصف الملف: ELETTRONICO

Relation: ispartofbook:3rd Annual Composites and Advanced Materials Expo, CAMX 2016; 3rd Annual Composites and Advanced Materials Expo, CAMX 2016; numberofpages:1; http://hdl.handle.net/11580/67073; https://www.scopus.com/inward/record.uri?eid=2-s2.0-85010064589&partnerID=40&md5=20e004d4a1a3aa73a5f0119cb2da6fb5

الاتاحة: http://hdl.handle.net/11580/67073
https://www.scopus.com/inward/record.uri?eid=2-s2.0-85010064589&partnerID=40&md5=20e004d4a1a3aa73a5f0119cb2da6fb5

المصدر: Вестник Казанского технологического университета.

مصطلحات موضوعية: КАЧЕСТВО,АНАЛИЗ ВИДОВ,ПОСЛЕДСТВИЯ ОТКАЗОВ,ПОТЕНЦИАЛЬНЫЙ ДЕФЕКТ,ПРИОРИТЕТНОЕ ЧИСЛО РИСКА,QUALITY OF ANALYSIS TYPES,THE CONSEQUENCES OF FAILURE,A POTENTIAL DEFECT BY PRIORITY RISK

وصف الملف: text/html

URL الوصول: https://explore.openaire.eu/search/publication?articleId=od______2806::50713a5b42b04bf7a8a7418793e9b881
http://cyberleninka.ru/article/n/metod-fmea-kak-put-povysheniya-kachestva-produktsii

المؤلفون: 梁莹

المساهمون: 姚俊峰

المصدر: http://210.34.4.13:8080/lunwen/detail.asp?serial=54806.

مصطلحات موضوعية: 软件潜在缺陷分析, 故障树分析, C语言, Software Potential Defect Analysis, Fault Tree Analysis, C Language

Relation: http://210.34.4.28/opac/openlink.php?strText=54071&doctype=ALL&strSearchType=callno; http://dspace.xmu.edu.cn/handle/2288/132465

الاتاحة: http://dspace.xmu.edu.cn/handle/2288/132465